Input/output systems and devices for use with superconducting devices
US-9762200-B2 · Sep 12, 2017 · US
US10651361B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10651361-B2 |
| Application number | US-201916248981-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 16, 2019 |
| Priority date | Nov 30, 2017 |
| Publication date | May 12, 2020 |
| Grant date | May 12, 2020 |
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A technique relates a structure. An inductive element is on a first surface. A capacitive element is on the first surface and a second surface. An interconnect structure is between the first surface and the second surface.
Opening claim text (preview).
What is claimed is: 1. A structure comprising: an inductive element on a first surface; a capacitive element on the first surface and a second surface, such that an interconnect structure is positioned between the first surface and the second surface; and a qubit on the second surface. 2. The structure of claim 1 , wherein the qubit is positioned a distance from the inductive element. 3. The structure of claim 1 , wherein the first surface and the second surface are opposite surfaces on a substrate. 4. The structure of claim 1 , wherein the first surface and the second surface are on different substrates. 5. The structure of claim 1 , wherein the qubit is on an opposite side of a substrate from the inductive element. 6. The structure of claim 1 , wherein the qubit is on a different substrate from the inductive element. 7. The structure of claim 1 , wherein the interconnect structure is a solder bump. 8. The structure of claim 1 , wherein the interconnect structure is a through-silicon via. 9. The structure of claim 1 , wherein the capacitive element comprises the interconnect structure. 10. The structure of claim 1 , wherein the inductive element and the capacitive element together form a readout resonator configured to readout the qubit. 11. The structure of claim 1 , wherein the interconnect structure is a through-silicon via. 12. The structure of claim 1 , wherein the inductive element and the capacitive element together form a readout resonator configured to readout the qubit. 13. A structure comprising: an inductive element on a first surface; a capacitive element on the first surface and a second surface such that the capacitive element is separate from the inductive element, wherein a qubit is on the second surface; and an interconnect structure between the first surface and the second surface. 14. The structure of claim 13 , wherein the first surface and the second surface are opposite surfaces on a substrate. 15. The structure of claim 13 , wherein the first surface and the second surface are on different substrates. 16. The structure of claim 13 , wherein the qubit is on an opposite side of a substrate from the inductive element. 17. The structure of claim 13 , wherein the qubit is on a different substrate from the inductive element. 18. The structure of claim 13 , wherein the capacitive element comprises the interconnect structure. 19. A structure comprising: an inductive element on a first surface; a capacitive element on the first surface and a second surface such that the capacitive element is separate from the inductive element; and an interconnect structure between the first surface and the second surface, wherein the interconnect structure is a solder bump.
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