Mid-K LTCC compositions and devices
US-9892853-B2 · Feb 13, 2018 · US
US10494306B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10494306-B2 |
| Application number | US-201615576321-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 2, 2016 |
| Priority date | Aug 5, 2015 |
| Publication date | Dec 3, 2019 |
| Grant date | Dec 3, 2019 |
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Electronic devices are produced from dielectric compositions comprising a mixture of precursor materials that, upon firing, forms a dielectric material comprising a barium-titanium-tungsten-silicon oxide.
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The invention claimed is: 1. A composition comprising a mixture of precursors that, upon firing, forms a dielectric material comprising: from 57.0 wt % to 73.0 wt % BaO; from 20.0 wt % to 40.0 wt % TiO 2 ; from 0.5 wt % to 20.0 wt % WO 3 ; from 0.05 wt % to 5.0 wt % SiO 2 ; from 0.1 to 10.0 wt % Bi 2 O 3 ; from 0.1 to 10.0 wt % ZnO; from 0.01 to 4.0 wt % B 2 O 3 ; from 0.01 to 5.0 wt % Li 2 O; from 0.01 to 2.0 wt % CuO; and from 0.01 to 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 2. A lead-free and cadmium-free dielectric paste comprising a solids portion, wherein the solids portion comprises the composition of claim 1 . 3. An electric or electronic component comprising, prior to firing, the composition of claim 1 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides of transition metals, carbides of transition metals, nitrides of transition metals, and borides of transition metals, 0.5-10 wt % of at least one glass frit, 10-40 wt % of an organic portion. 4. An electric or electronic component comprising, prior to firing, the lead-free and cadmium-free dielectric paste of claim 2 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides of transition metals, carbides of transition metals, nitrides of transition metals, and borides of transition metals, 0.5-10 wt % of at least one glass frit, 10-40 wt % of an organic portion. 5. A method of forming an electronic component comprising: applying the composition of claim 1 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 6. The method of claim 5 , wherein the firing is conducted at a temperature of from 800° C. to 1000° C. 7. The method of claim 6 , wherein the firing is conducted in air. 8. A method of forming an electronic component comprising: applying the paste of claim 2 to a substrate; and firing the substrate at a temperature sufficient to sinter the paste. 9. The method of claim 8 , wherein the firing is conducted at a temperature of from 800° C. to 1000° C. 10. A composition comprising a mixture of precursors, the mixture of precursors comprising: from 57.0 wt % to 73.0 wt % BaO; from 20.0 wt % to 40.0 wt % TiO 2 ; from 0.5 wt % to 20.0 wt % WO 3 ; from 0.05 wt % to 5.0 wt % SiO 2 ; from 0.1 to 10.0 wt % Bi 2 O 3 ; from 0.1 to 10.0 wt % ZnO; from 0.01 to 4.0 wt % H 3 BO 3 ; from 0.01 to 5.0 wt % Li 2 CO 3 ; from 0.01 to 2.0 wt % CuO; and from 0.01 to 2.0 wt % of at least one selected from the group consisting of MnO 2 , Mn 2 O 3 , and MnO. 11. A lead-free and cadmium-free-dielectric paste comprising a solids portion, the solids portion comprising the composition of claim 10 . 12. An electric or electronic component comprising, prior to firing, the composition of claim 10 , together with a conductive paste comprising: 60-90 wt % Ag+Pd+Pt+Au, 1-10 wt % of an additive selected from the group consisting of silicides of transition metals, carbides of transition metals, nitrides of transition metals, and borides of transition metals, 0.5-10 wt % of at least one glass frit, 10-40 wt % of an organic portion. 13. A method of forming an electronic component comprising: applying the composition of claim 10 to a substrate; and firing the substrate at a temperature sufficient to sinter the composition. 14. The method of claim 13 , wherein the firing is conducted at a temperature of from 800° C. to 1000° C. 15. The method of claim 14 , wherein the firing is conducted in air. 16. A method of forming an electronic component comprising: applying the paste of claim 11 to a substrate, and firing the substrate at a temperature sufficient to sinter the paste.
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