Apparatus for testing electronic devices

Patent metadata

Field	Value
Publication number	US-2024103068-A1
Application number	US-202318523604-A
Country	US
Kind code	A1
Filing date	Nov 29, 2023
Priority date	Apr 27, 2005
Publication date	Mar 28, 2024
Grant date	—

Abstract

An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

First claim

What is claimed:

1 . An apparatus for testing an integrated circuit of a device, comprising:
a power source; a signal source; an apparatus frame; a holder, having a surface against which the device is placed, mounted to the apparatus frame; a cartridge frame mounted to the apparatus frame; a contactor support structure; a contactor interface on the contactor support structure; a plurality of terminals held by the contactor support structure; a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals; and an actuator connected between the cartridge frame and the contactor support structure, having first and second portions that are movable relative to one another to move the contactor support structure relative to the cartridge frame and toward the surface of the holder so that the terminals are urged against contacts of the device; a power electrical path connecting the power source to a power terminal of the terminals held by the contactor support structure; and a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the contactor support structure.

2 . The apparatus of claim 1 , wherein the first and second portions of the actuator are a cylinder and a piston, respectively, the piston being located in the cylinder so that the cylinder and the piston jointly define a volume, further comprising a fluid line connected to the volume to modify a pressure of the volume and move the piston relative to the cylinder.

3 . The apparatus of claim 1 , further comprising a travel sensor for measuring the movement of the contactor support structure relative to the cartridge frame.

4 . The apparatus of claim 3 , wherein the cartridge frame includes a lower backing plate and a support structure, and wherein the travel sensor includes an outer portion attached to the support structure and an inner portion attached to the backing plate, and wherein actuation of the actuator causes the relative movement between the outer portion and the inner portion.

5 . The apparatus of claim 4 , wherein the travel sensor measures the change of inductance or capacitance between the outer portion and the inner portion.

6 . An apparatus for testing integrated circuits of devices, comprising:
at least one apparatus frame; a holder for a device, secured to the apparatus frame; a cartridge frame; formations on the cartridge frame for mounting the cartridge frame in a fixed position to the apparatus frame; a contactor support structure held by the cartridge frame; a contactor interface on the contactor support structure; a plurality of terminals held by the contactor support structure; a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals; an actuator connected between the cartridge frame and the contactor support structure, having first and second portions that are movable relative to one another to move the contactor support structure relative to the cartridge frame; a plurality of terminals held by the contactor support structure, the holder and contactor support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device; a power source; a power electrical path connecting the power source through the contactor interface to a power terminal of the terminals held by the contactor support structure; a signal source; and a plurality of signal electrical paths, each connecting the signal source through the contactor interface to a respective signal terminal of the terminals held by the contactor support structure.

7 . The apparatus of claim 6 , wherein the first and second portions of the actuator use a cylinder and a piston, respectively, the piston being located in the cylinder so that the cylinder and the piston jointly define a volume, further comprising a fluid line connected to the volume to modify a pressure of the volume and move the piston relative to the cylinder.

8 . The apparatus of claim 6 , further comprising a travel sensor for measuring the movement of the cartridge frame relative to the contactor support structure.

9 . The apparatus of claim 8 , wherein the cartridge frame includes a lower backing plate and a support structure, and wherein the travel sensor includes an outer portion attached to the support structure and an inner portion attached to the backing plate, and wherein actuation of the actuator causes the relative movement between the outer portion and the inner portion.

10 . The apparatus of claim 9 , wherein the travel sensor measures the change of inductance or capacitance between the outer portion and the inner portion.

11 . In an apparatus for testing integrated circuits of devices, comprising:
at least one frame; a holder for the device, secured to the frame; a support structure held by the frame; a plurality of terminals held by the support structure, the holder and support structure being movable relative to one another so that each one of the terminals releasably makes contact with a respective contact of the device; a power source; a power electrical path connecting the power source to a power terminal of the terminals held by the support structure; a signal source; and a plurality of signal electrical paths, each connecting the signal source to a respective signal terminal of the terminals held by the support structure, a method of testing an integrated circuit of a device, a method comprising: holding the device against a surface of a holder; actuating an actuator to move a contactor support structure relative to a frame and urge terminals on the contactor support structure against contacts on the device; and providing signals through the terminals and contacts to the integrated circuit.

12 . The method of claim 11 , further comprising moving the device with the holder relative to the frame in a direction toward the contactor support structure.

13 . The method of claim 12 , further comprising utilizing the actuator to move the terminals into contact with the contacts.

14 . The method of claim 12 , wherein actuating the actuator occurs before or after moving the device with the holder relative to the frame.

15 . The method of claim 11 , wherein the actuator includes a cylinder and a piston in the cylinder, the piston being moved relative to the cylinder by changing a pressure on a surface of the cylinder.

16 . The method of claim 11 , further comprising measuring the movement of the actuator.

17 . The method of claim 16 , further comprising controlling the speed of movement of the actuator.

18 . An apparatus for testing an integrated circuit of a device, comprising:
a power source; a signal source; an apparatus frame; a holder, having a surface against which the device is placed, mounted to the apparatus frame; a cartridge frame mounted to the apparatus frame; a contactor support structure; a contactor interface on the contactor support structure; a plurality of terminals held by the contactor support structure; a plurality of conductors, held by the contactor support structure, connecting the interface to the terminals; a variable-force actuator connected between the cartridge frame and the contactor support structure, having first and second portions that are movable relative to one another to move the contactor support structure relative to the cartridge frame and toward the surface of the hol

Assignees

• Aehr Test Systems

Inventors

• Richmond Ii Donald P
• Deboe Kenneth W
• Uher Frank O
• Jovanovic Jovan
• Lindsey Scott E
• Maenner Thomas T
• Shepherd Patrick M
• Tyson Jeffrey L
• Carbone Mark C
• Burke Paul W
• Cao Doan D
• Tomic James F
• Vu Long V

Classifications

• H10P74/00 Primary

  Testing or measuring during manufacture or treatment of wafers, substrates or devices · CPC title

• G01R31/287 Primary

  Procedures; Software aspects · CPC title

• G01R31/003

  Environmental or reliability tests (of individual semiconductors G01R31/2642; of PCB's G01R31/2817; of IC's G01R31/2855; of other circuits G01R31/2849) · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title