Electronics tester

Patent metadata

Field	Value
Publication number	US-2025093398-A1
Application number	US-202418947530-A
Country	US
Kind code	A1
Filing date	Nov 14, 2024
Priority date	Mar 3, 2017
Publication date	Mar 20, 2025
Grant date	—

Abstract

A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.

First claim

1 - 55 . (canceled)

56 . A cartridge comprising:
a socket of insulative material and having upper and lower sides and a formation on the upper side to hold an electronic device; a set of contacts held in the socket to connect to the electronic device; a set of terminals connected to the set of contacts held by the socket; a circuit board, the set of terminals connected to the set of contacts being connected to a set of contacts on the circuit board; a lid; a detector mounted to the lid, the lid being movable to be positioned over the socket with the detector located in a position to detect a feature of the electronic device when and due to power being supplied through at least one of the set of terminals held by the socket to the electronic device; and a measurement channel connecting the detector to an interface on the circuit board.

57 . The cartridge of claim 56 , wherein the detector is a light detector.

58 . The cartridge of claim 57 , wherein the light detector converts light power to electric power, the measurement channel is an electric conductor and the interface on the circuit board is an electric contact.

59 . The cartridge of claim 56 , further comprising:
a first set of pins held by the socket, opposing ends of each one of the first set of pins forming one of the contacts held by the socket and one of the terminals connected to the respective terminal; and a detector measurement pin held by the socket and forming part of the measurement channel.

60 . The cartridge of claim 59 , further comprising:
a terminal on the lid, the detector measurement pin having a contact that engages with the terminal on the lid.

61 . The cartridge of claim 60 , wherein the contacts of the first set of pins are in a first plane and the contact on the detector measurement pin is in a second plane that is parallel and spaced from the first plane.

62 . The cartridge of claim 61 , wherein the measurement pin has a terminal on an end thereof opposing the contact, the terminals on the first set of pins and the terminals on the measurement pin being in the same plane.

63 . The cartridge of claim 62 , wherein the first set of pins and the measurement pin are simultaneously depressible by moving the lid towards the socket.

64 . The cartridge of claim 63 , further comprising:
a detector power pin held by the socket and providing power to the detector.

65 . A method of testing one or more electronic devices comprising:
releasably holding an electronic device in a socket of insulative material and having upper and lower sides and a formation on the upper side to hold an electronic device; connecting a set of contacts held in the socket to the electronic device; connecting a set of terminals connected to the set of contacts to a set of contacts on a circuit board; moving a lid having a detector mounted thereto over the socket; connecting the detector through a measurement channel to an interface on the circuit board; supplying power through at least one of the contacts held by the socket to the electronic device; detecting a feature of the electronic device when and due to power being supplied through at least one of the contacts held by the socket to the electronic device; and measuring the feature through the interface.

66 - 96 . (canceled)

Assignees

• Aehr Test Systems

Inventors

• Jovanovic Jovan
• Deboe Kenneth W
• Steps Steven C
• Lindsey Scott E

Classifications

• H10P72/76

  using mechanical means, e.g. clamps or pinches · CPC title

• H10P72/7616

  characterised by a coating, a hardness or a material · CPC title

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title

• G01R31/2601

  Apparatus or methods therefor (G01R31/2607, G01R31/2642 take precedence) · CPC title

• H05K7/1417

  having securing means for mounting boards, plates or wiring boards (H05K7/1461 takes precedence) · CPC title