Gate stacks with multiple high-κ dielectric layers
US-11961895-B2 · Apr 16, 2024 · US
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Linder Barry patents
Linder Barry is listed as an inventor on 19 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Linder Barry |
| Total patents | 19 |
| First publication | Dec 29, 2016 |
| Latest publication | Apr 16, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
RRAM structures in the BEOL
US-11877458-B2 · Jan 16, 2024 · US
Fabrication of phase change memory cell in integrated circuit
US-11647681-B2 · May 9, 2023 · US
Gate stacks with multiple high-k dielectric layers
US-2023075740-A1 · Mar 9, 2023 · US
Switchable metal insulator metal capacitor
US-11276748-B2 · Mar 15, 2022 · US
Rram structures in the beol
US-2021280638-A1 · Sep 9, 2021 · US
Detection of performance degradation in integrated circuits
US-11105856-B2 · Aug 31, 2021 · US
Switchable metal insulator metal capacitor
US-2021036096-A1 · Feb 4, 2021 · US
Fabrication of phase change memory cell in integrated circuit
US-2021020836-A1 · Jan 21, 2021 · US
Fabrication of phase change memory cell in integrated circuit
US-10840447-B2 · Nov 17, 2020 · US
Recent patents
Latest publications not already listed above.
Fabrication of phase change memory cell in integrated circuit
US-2020295261-A1 · Sep 17, 2020 · US
Energy storage component delivery system
US-2020231278-A1 · Jul 23, 2020 · US
Detection of performance degradation in integrated circuits
US-2020150181-A1 · May 14, 2020 · US
On-chip combined hot carrier injection and bias temperature instability monitor
US-10388580-B2 · Aug 20, 2019 · US
Autonomic supply voltage compensation for degradation of circuits over circuit lifetime
US-10365702-B2 · Jul 30, 2019 · US
Autonomic Supply Voltage Compensation for Degradation of Circuits over Circuit Lifetime
US-2018292879-A1 · Oct 11, 2018 · US
On-chip combined hot carrier injection and bias temperature instability monitor
US-2018211894-A1 · Jul 26, 2018 · US
On-chip combined hot carrier injection and bias temperature instability monitor
US-10002810-B2 · Jun 19, 2018 · US
On-chip combined hot carrier injection and bias temperature instability monitor
US-2016377672-A1 · Dec 29, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| IBM | 19 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10N70/011 | 8 |
| H10N70/8413 | 6 |
| H10N70/231 | 6 |
| H10B63/80 | 6 |
| H10N70/823 | 6 |