Nonvolatile memory device and method of detecting defective memory cell block of nonvolatile memory device
US-12512169-B2 · Dec 30, 2025 · US
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Jung Wontaeck patents
Jung Wontaeck is listed as an inventor on 22 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Jung Wontaeck |
| Total patents | 22 |
| First publication | Jan 13, 2022 |
| Latest publication | Dec 30, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Memory device, memory controller, and memory system including the same
US-12474874-B2 · Nov 18, 2025 · US
Memory device for detecting fail cell and operation method thereof
US-12340849-B2 · Jun 24, 2025 · US
Method of detecting a not-open string (N/O string), converting target data, with a value that matches inhibit data, to be programmed to target memory cells in the N/O string, and programming the memory cells
US-12230343-B2 · Feb 18, 2025 · US
Memory device and method for determining start point and end point of verification operation of target state during programming
US-12205656-B2 · Jan 21, 2025 · US
Memory system including a nonvolatile memory device, and an erasing method thereof
US-11894092-B2 · Feb 6, 2024 · US
Nonvolatile memory device and method of detecting defective memory cell block of nonvolatile memory device
US-2024021255-A1 · Jan 18, 2024 · US
Non-volatile memory device and method of incrementally programming the same using a plurality of program loops
US-11869582-B2 · Jan 9, 2024 · US
Memory device, memory controller, and memory system including the same
US-2023333782-A1 · Oct 19, 2023 · US
Nonvolatile memory device and method of detecting defective memory cell block of nonvolatile memory device
US-11763901-B2 · Sep 19, 2023 · US
Recent patents
Latest publications not already listed above.
Memory device, memory controller, and memory system including the same
US-11726722-B2 · Aug 15, 2023 · US
Memory device for detecting fail cell and operation method thereof
US-2023148408-A1 · May 11, 2023 · US
Memory device and method for determining start point and end point of verification operation of target state during programming
US-2023112849-A1 · Apr 13, 2023 · US
Memory device with conditional skip of verify operation during write and operating method thereof
US-11594293-B2 · Feb 28, 2023 · US
Method of erasing data in nonvolatile memory device, nonvolatile memory device performing the same and memory controller performing the same
US-11380403-B2 · Jul 5, 2022 · US
Non-volatile memory device and method of programming the same
US-2022172775-A1 · Jun 2, 2022 · US
Nonvolatile memory device and method of detecting defective memory cell block of nonvolatile memory device
US-2022051738-A1 · Feb 17, 2022 · US
Memory device, memory controller, and memory system including the same
US-2022050640-A1 · Feb 17, 2022 · US
Memory system including a nonvolatile memory device, and an erasing method thereof
US-2022044758-A1 · Feb 10, 2022 · US
Memory device and a memory system including the same
US-2022028466-A1 · Jan 27, 2022 · US
Method of erasing data in nonvolatile memory device, nonvolatile memory device performing the same and memory controller performing the same
US-2022013178-A1 · Jan 13, 2022 · US
Memory device with conditional skip of verify operation during write and operating method thereof
US-2022013184-A1 · Jan 13, 2022 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 22 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C16/0483 | 20 |
| G11C16/14 | 14 |
| G11C16/08 | 14 |
| G11C16/16 | 14 |
| G11C16/10 | 12 |