Radiation detection apparatus and radiation imaging system
US-12529804-B2 · Jan 20, 2026 · US
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Ishida Yohei patents
Ishida Yohei is listed as an inventor on 39 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ishida Yohei |
| Total patents | 39 |
| First publication | Jan 15, 2015 |
| Latest publication | Jan 20, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Radiation detection apparatus, radiation imaging system, and manufacturing method of radiation detection apparatus
US-12345840-B2 · Jul 1, 2025 · US
Plasma processing apparatus, analysis apparatus, and storage medium
US-2025006464-A1 · Jan 2, 2025 · US
Radiation detection apparatus and radiation imaging system
US-2024159922-A1 · May 16, 2024 · US
Plasma processing apparatus
US-11887816-B2 · Jan 30, 2024 · US
Radiation detection apparatus, radiation imaging system, and manufacturing method of radiation detection apparatus
US-2023273327-A1 · Aug 31, 2023 · US
Microwave output device and plasma processing apparatus
US-11587769-B2 · Feb 21, 2023 · US
Plasma processing apparatus
US-11527386-B2 · Dec 13, 2022 · US
Plasma processing apparatus
US-2022130643-A1 · Apr 28, 2022 · US
Radiation imaging apparatus and radiation imaging system
US-11280919-B2 · Mar 22, 2022 · US
Recent patents
Latest publications not already listed above.
Method of determining correction function
US-11249126-B2 · Feb 15, 2022 · US
Microwave output device and plasma processing apparatus
US-2022028661-A1 · Jan 27, 2022 · US
Method of determining correction function
US-11209515-B2 · Dec 28, 2021 · US
Plasma processing apparatus
US-2021280390-A1 · Sep 9, 2021 · US
Microwave output device and plasma processing apparatus
US-10971337-B2 · Apr 6, 2021 · US
Method of determining correction function
US-2020341106-A1 · Oct 29, 2020 · US
Method of determining correction function
US-2020341043-A1 · Oct 29, 2020 · US
Detection device, microwave output device and plasma processing apparatus
US-10796886-B2 · Oct 6, 2020 · US
Plasma processing apparatus, abnormality determination method, and microwave generator
US-10662531-B2 · May 26, 2020 · US
Radiation imaging apparatus and radiation imaging system
US-2020124749-A1 · Apr 23, 2020 · US
Detection device, microwave output device and plasma processing apparatus
US-2020035462-A1 · Jan 30, 2020 · US
Microwave output device and plasma processing apparatus
US-2019057844-A1 · Feb 21, 2019 · US
Plasma processing apparatus
US-2018277339-A1 · Sep 27, 2018 · US
Scintillator, method of manufacturing the same, radiation imaging apparatus, and radiation imaging system
US-10067242-B2 · Sep 4, 2018 · US
Radiation detection apparatus, radiation imaging system, and manufacturing method
US-9971043-B2 · May 15, 2018 · US
Radiation detection apparatus, method of manufacturing the same, and imaging system
US-9568614-B2 · Feb 14, 2017 · US
Scintillator, method of manufacturing the same, radiation imaging apparatus, and radiation imaging system
US-2017038482-A1 · Feb 9, 2017 · US
Radiation detection apparatus, radiation imaging system, and manufacturing method
US-2016274250-A1 · Sep 22, 2016 · US
Radiation imaging apparatus, method of manufacturing the same, and radiation inspection apparatus
US-2016172414-A1 · Jun 16, 2016 · US
Microwave plasma processing apparatus and microwave supply method
US-9241397-B2 · Jan 19, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Tokyo Electron Ltd | 20 |
| Canon Kk | 19 |
| Tokyo Keiki Inc | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/32311 | 15 |
| G01T1/202 | 11 |
| G01T1/20 | 10 |
| H01J37/32201 | 10 |
| H01J37/32275 | 9 |