Adaptive sensing time for memory operations
US-2025166708-A1 · May 22, 2025 · US
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DIEP Vinh patents
DIEP Vinh is listed as an inventor on 39 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | DIEP Vinh |
| Total patents | 39 |
| First publication | Jul 28, 2015 |
| Latest publication | May 22, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Adaptive sensing time for memory operations
US-12237015-B2 · Feb 25, 2025 · US
Adaptive sensing time for memory operations
US-2024055052-A1 · Feb 15, 2024 · US
Multi-pass programming process for memory device which omits verify test in first program pass
US-11037640-B2 · Jun 15, 2021 · US
Memory device with compensation for program speed variations due to block oxide thinning
US-11024387-B2 · Jun 1, 2021 · US
Memory device with compensation for program speed variations due to block oxide thinning
US-2021082515-A1 · Mar 18, 2021 · US
Memory device with compensation for erase speed variations due to blocking oxide layer thinning
US-10923197-B2 · Feb 16, 2021 · US
Memory device with compensation for program speed variations due to block oxide thinning
US-10878914-B2 · Dec 29, 2020 · US
Multi-state programming in memory device with loop-dependent bit line voltage during verify
US-10854300-B2 · Dec 1, 2020 · US
Memory device with compensation for erase speed variations due to blocking oxide layer thinning
US-2020335168-A1 · Oct 22, 2020 · US
Recent patents
Latest publications not already listed above.
Multi-pass programming process for memory device which omits verify test in first program pass
US-10811109-B2 · Oct 20, 2020 · US
Multi-state programming in memory device with loop-dependent bit line voltage during verify
US-2020312410-A1 · Oct 1, 2020 · US
Multi-pass programming process for memory device which omits verify test in first program pass
US-2020312414-A1 · Oct 1, 2020 · US
Memory device with compensation for erase speed variations due to blocking oxide layer thinning
US-2020265897-A1 · Aug 20, 2020 · US
Memory device with compensation for erase speed variations due to blocking oxide layer thinning
US-10741253-B1 · Aug 11, 2020 · US
Memory device with compensation for program speed variations due to block oxide thinning
US-2020243141-A1 · Jul 30, 2020 · US
Multi-state programming in memory device with loop-dependent bit line voltage during verify
US-10706941-B1 · Jul 7, 2020 · US
Multi-pass programming process for memory device which omits verify test in first program pass
US-2020211663-A1 · Jul 2, 2020 · US
Memory device with compensation for program speed variations due to block oxide thinning
US-10665301-B1 · May 26, 2020 · US
Memory device with reduced neighbor word line interference using adjustable voltage on source-side unselected word line
US-10636501-B1 · Apr 28, 2020 · US
Foldable case for use with an electronic device
US-10591956-B2 · Mar 17, 2020 · US
Three dimensional NAND memory device with drain select gate electrode shared between multiple strings
US-10566059-B2 · Feb 18, 2020 · US
Multi-pass programming with modified pass voltages to tighten threshold voltage distributions
US-10510413-B1 · Dec 17, 2019 · US
Preventing refresh of voltages of dummy memory cells to reduce threshold voltage downshift for select gate transistors
US-10482981-B2 · Nov 19, 2019 · US
Three dimensional nand memory device with drain select gate electrode shared between multiple strings
US-2019333581-A1 · Oct 31, 2019 · US
Adjusting voltage on adjacent word line during verify of memory cells on selected word line in multi-pass programming
US-10446244-B1 · Oct 15, 2019 · US
Adjusting voltage on adjacent word line during verify of memory cells on selected word line in multi-pass programming
US-2019311772-A1 · Oct 10, 2019 · US
Picture frame smartphone case
US-D859385-S · Sep 10, 2019 · US
Picture frame smartphone case
US-D858500-S · Sep 3, 2019 · US
Preventing refresh of voltages of dummy memory cells to reduce threshold voltage downshift for select gate transistors
US-2019259462-A1 · Aug 22, 2019 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Sandisk Technologies Llc | 30 |
| Apple Inc | 4 |
| Micron Technology Inc | 3 |
| Bby Solutions Inc | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G11C16/0483 | 30 |
| G11C16/10 | 27 |
| G11C16/08 | 26 |
| G11C16/26 | 22 |
| G11C11/5628 | 22 |