Particle-induced x-ray emission using light and heavy particle beams
US-2025189469-A1 · Jun 12, 2025 · US
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Botman Aurelien Philippe Jean Maclou patents
Botman Aurelien Philippe Jean Maclou is listed as an inventor on 21 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Botman Aurelien Philippe Jean Maclou |
| Total patents | 21 |
| First publication | Dec 31, 2015 |
| Latest publication | Jun 12, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams
US-2024418660-A1 · Dec 19, 2024 · US
Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beams
US-12061159-B2 · Aug 13, 2024 · US
Condensate precursors and contaminant purge apparatus and methods
US-2024222068-A1 · Jul 4, 2024 · US
Method and system for preparing a specimen
US-2024071720-A1 · Feb 29, 2024 · US
Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams
US-2023341341-A1 · Oct 26, 2023 · US
Method for large-area 3d analysis of samples using glancing incidence fib milling
US-2021118646-A1 · Apr 22, 2021 · US
Method for alignment of a light beam to a charged particle beam
US-10777383-B2 · Sep 15, 2020 · US
Adaptive beam current for high throughput patterning
US-10415133-B2 · Sep 17, 2019 · US
Collision ionization source
US-10325750-B2 · Jun 18, 2019 · US
Recent patents
Latest publications not already listed above.
Method of modifying a sample surface layer from a microscopic sample
US-10105734-B2 · Oct 23, 2018 · US
Collision ionization source
US-2018211807-A1 · Jul 26, 2018 · US
Collision ionization ion source
US-9899181-B1 · Feb 20, 2018 · US
Localized, in-vacuum modification of small structures
US-9812286-B2 · Nov 7, 2017 · US
Adaptive control for charged particle beam processing
US-2017002467-A1 · Jan 5, 2017 · US
Adaptive beam current for high throughput patterning
US-2017002455-A1 · Jan 5, 2017 · US
Integrated light optics and gas delivery in a charged particle lens
US-9478390-B2 · Oct 25, 2016 · US
Method of modifying a sample surface layer from a microscopic sample
US-2016199878-A1 · Jul 14, 2016 · US
Localized, in-vacuum modification of small structures
US-2016189920-A1 · Jun 30, 2016 · US
Localized, in-vacuum modification of small structures
US-9255339-B2 · Feb 9, 2016 · US
Integrated light optics and gas delivery in a charged particle lens
US-2015380205-A1 · Dec 31, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 21 |
| Botman Aurelien Philippe Jean Maclou | 1 |
| Toth Milos | 1 |
| Randolph Steven | 1 |
| Narum David H | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 9 |
| H01J37/20 | 8 |
| H01J37/26 | 7 |
| H01J37/08 | 7 |
| H01J2237/31749 | 6 |