Method and system for 3d reconstruction of wafer structure by diagonal milling
US-2025391707-A1 · Dec 25, 2025 · US
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Bar-Or Ron patents
Bar-Or Ron is listed as an inventor on 7 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Bar-Or Ron |
| Total patents | 7 |
| First publication | Mar 17, 2016 |
| Latest publication | Dec 25, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Algorithm for 3d reconstruction of diagonally cut semiconductor logic structure
US-2025391114-A1 · Dec 25, 2025 · US
Three-dimensional surface metrology of wafers
US-11662324-B1 · May 30, 2023 · US
Chuck for supporting a wafer
US-10446434-B2 · Oct 15, 2019 · US
Evaluation system and a method for evaluating a substrate
US-9835563-B2 · Dec 5, 2017 · US
Chuck for supporting a wafer
US-2017309511-A1 · Oct 26, 2017 · US
Evaluation system and a method for evaluating a substrate
US-2016077016-A1 · Mar 17, 2016 · US
Recent patents
Latest publications not already listed above.
No data yet.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 7 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P72/0616 | 3 |
| G01Q60/24 | 3 |
| H10P74/203 | 2 |
| H01L21/67288 | 2 |
| G01N2223/6116 | 2 |