System, method and computer program product for object examination
US-11592400-B2 · Feb 28, 2023 · US
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Amzaleg Moshe patents
Amzaleg Moshe is listed as an inventor on 26 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Amzaleg Moshe |
| Total patents | 26 |
| First publication | Jun 30, 2015 |
| Latest publication | Feb 28, 2023 |
Notable patents
Publications ranked by popularity score, then publication date.
System, method and computer program product for object examination
US-2021109029-A1 · Apr 15, 2021 · US
Method, computer program product and system for detecting manufacturing process defects
US-10957567-B2 · Mar 23, 2021 · US
System, method and computer program product for object examination
US-10871451-B2 · Dec 22, 2020 · US
Method, computer program product and system for detecting manufacturing process defects
US-2020118855-A1 · Apr 16, 2020 · US
System, a method and a computer program product for size estimation
US-10545020-B2 · Jan 28, 2020 · US
System, method and computer program product for object examination
US-2019391085-A1 · Dec 26, 2019 · US
Method of defect detection and system thereof
US-10460434-B2 · Oct 29, 2019 · US
System, method and computer program product for object examination
US-10408764-B2 · Sep 10, 2019 · US
System, a method and a computer program product for fitting based defect detection
US-10290092-B2 · May 14, 2019 · US
Recent patents
Latest publications not already listed above.
Method of generating an examination recipe and system thereof
US-10290087-B2 · May 14, 2019 · US
Method of detecting repeating defects and system thereof
US-10275872-B2 · Apr 30, 2019 · US
Method of generating an examination recipe and system thereof
US-2019080447-A1 · Mar 14, 2019 · US
System, method and computer program product for object examination
US-2019079022-A1 · Mar 14, 2019 · US
Method of detecting repeating defects and system thereof
US-2019066292-A1 · Feb 28, 2019 · US
Method of defect detection and system thereof
US-2019066291-A1 · Feb 28, 2019 · US
System, method and computer program product for defect detection based on multiple references
US-9767356-B2 · Sep 19, 2017 · US
Systems, methods and computer program products for signature detection
US-9613255-B2 · Apr 4, 2017 · US
Method, system, and computer program product for detection of defects based on multiple references
US-9558548-B2 · Jan 31, 2017 · US
Systems, methods and computer program products for signature detection
US-2016292492-A1 · Oct 6, 2016 · US
System, a method and a computer program product for patch-based defect detection
US-9235885-B2 · Jan 12, 2016 · US
System, a method and a computer program product for fitting based defect detection
US-2015332451-A1 · Nov 19, 2015 · US
Method, system, and computer program product for detection of defects based on multiple references
US-2015287178-A1 · Oct 8, 2015 · US
System, method and computer program product for defect detection based on multiple references
US-2015278597-A1 · Oct 1, 2015 · US
Method, system, and computer program product for detection of defects based on multiple references
US-9070180-B2 · Jun 30, 2015 · US
System, method and computer program product for defect detection based on multiple references
US-9070014-B2 · Jun 30, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Applied Materials Israel Ltd | 29 |
| Amzaleg Moshe | 2 |
| Cohen Yehuda | 2 |
| Dodzin Nir Ben-David | 2 |
| Rozenman Efrat | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/30148 | 25 |
| G06T2207/10061 | 14 |
| G06T7/001 | 13 |
| G06T7/0004 | 12 |
| G06T7/0006 | 10 |