Sensing and detection of esd and other transient overstress events
US-2017346280-A1 · Nov 30, 2017 · US
related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/2879 |
| Official title | {related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads} |
| Display label | related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads |
| Total patents | 684 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is growing.
| Year | Patents |
|---|---|
| 2015 | 23 |
| 2016 | 24 |
| 2017 | 30 |
| 2018 | 44 |
| 2019 | 40 |
| 2020 | 49 |
| 2021 | 72 |
| 2022 | 85 |
| 2023 | 94 |
| 2024 | 91 |
| 2025 | 109 |
| 2026 | 23 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Degradation detection circuit and degradation adjustment apparatus including the same
US-9823297-B2 · Nov 21, 2017 · US
Internal voltage monitoring for integrated circuit devices
US-9804207-B1 · Oct 31, 2017 · US
Wear-out monitor device
US-2017299649-A1 · Oct 19, 2017 · US
Wear-out monitor device
US-2017299650-A1 · Oct 19, 2017 · US
Current Distribution Device Protected Against Over-Voltage Conditions
US-2017292987-A1 · Oct 12, 2017 · US
Circuit for testing and analyzing tsv and method of testing the same
US-2017269150-A1 · Sep 21, 2017 · US
Measuring power consumption in an integrated circuit
US-9709625-B2 · Jul 18, 2017 · US
Integrated time dependent dielectric breakdown reliability testing
US-2017122999-A1 · May 4, 2017 · US
Test device and test system including the same
US-9612276-B2 · Apr 4, 2017 · US
Dynamic operating surface for integrated circuits
US-9563220-B1 · Feb 7, 2017 · US
Electronics tester with group and individual current configurations
US-2017030965-A1 · Feb 2, 2017 · US
Devices and methods for testing integrated circuits
US-2017003342-A1 · Jan 5, 2017 · US
On-chip combined hot carrier injection and bias temperature instability monitor
US-2016377672-A1 · Dec 29, 2016 · US
Noise inspection apparatus
US-2016341796-A1 · Nov 24, 2016 · US
Electronics tester with hot fluid thermal control
US-9500702-B2 · Nov 22, 2016 · US
Brown-Out Detector
US-2016334470-A1 · Nov 17, 2016 · US
Systems and methods for implementing S/SSTDR measurements
US-9476932-B2 · Oct 25, 2016 · US
Power-On-Reset Detector
US-2016308514-A1 · Oct 20, 2016 · US
Power-on-reset detector
US-9473114-B1 · Oct 18, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/2879?
- CPC G01R31/2879 is the Cooperative Patent Classification code for “related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads.”
- How many patents are filed under CPC G01R31/2879 (related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads)?
- Our database includes 684 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/2879 growing?
- Publication counts under this code: 91 in 2024 vs 109 in 2025 (latest complete years).