Machine learning model training using de-noised data and model prediction with noise correction
US-12416662-B2 · Sep 16, 2025 · US
for curve tracing of semiconductor characteristics, e.g. on oscilloscope
for curve tracing of semiconductor characteristics, e.g. on oscilloscope · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/2603 |
| Official title | {for curve tracing of semiconductor characteristics, e.g. on oscilloscope} |
| Display label | for curve tracing of semiconductor characteristics, e.g. on oscilloscope |
| Total patents | 51 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 3 |
| 2016 | 3 |
| 2017 | 2 |
| 2018 | 4 |
| 2019 | 2 |
| 2020 | 5 |
| 2021 | 12 |
| 2022 | 3 |
| 2023 | 5 |
| 2024 | 7 |
| 2025 | 5 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Inspection device, inspection method, and program
US-2025216438-A1 · Jul 3, 2025 · US
Analyzing an operation of a power semiconductor device
US-12345754-B2 · Jul 1, 2025 · US
Testing apparatus and testing method
US-12298340-B2 · May 13, 2025 · US
Techniques for waveform detection of periodic signals using voltage contrast
US-2025069842-A1 · Feb 27, 2025 · US
In-situ testing system for semiconductor device in aerospace irradiation environment
US-12146908-B1 · Nov 19, 2024 · US
Method for measuring current-voltage characteristic
US-2024329111-A1 · Oct 3, 2024 · US
Method for measuring current-voltage characteristic
US-12038468-B2 · Jul 16, 2024 · US
Testing apparatus and testing method
US-2024142510-A1 · May 2, 2024 · US
De-skew method for dynamic testing using transfer function of current sensor
US-2024069070-A1 · Feb 29, 2024 · US
Method and apparatus for determining output charge of wide bandgap devices without hardware modification
US-2024044968-A1 · Feb 8, 2024 · US
Dynamic vertical signal calibration in a test and measurement instrument
US-2024036143-A1 · Feb 1, 2024 · US
Signal analyzer and method of processing data from an input signal
US-11798618-B2 · Oct 24, 2023 · US
Power module for operating an electric vehicle drive with improved temperature determination of the power semiconductors
US-11728748-B2 · Aug 15, 2023 · US
Machine learning model training using de-noised data and model prediction with noise correction
US-2023228803-A1 · Jul 20, 2023 · US
Pulsed high current technique for characterization of device under test
US-11705894-B2 · Jul 18, 2023 · US
Analyzing an operation of a power semiconductor device
US-2023096094-A1 · Mar 30, 2023 · US
Method for diagnosing open-circuit fault of switching transistor of single-phase half-bridge five-level inverter
US-2022198244-A1 · Jun 23, 2022 · US
Method for determining a corrected current-voltage characteristic curve of an electrical system
US-11336225-B2 · May 17, 2022 · US
Multi-lane optical-electrical device testing using automated testing equipment
US-2022038176-A1 · Feb 3, 2022 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/2603?
- CPC G01R31/2603 is the Cooperative Patent Classification code for “for curve tracing of semiconductor characteristics, e.g. on oscilloscope.”
- How many patents are filed under CPC G01R31/2603 (for curve tracing of semiconductor characteristics, e.g. on oscilloscope)?
- Our database includes 51 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/2603 growing?
- Publication counts under this code: 7 in 2024 vs 5 in 2025 (latest complete years).