Testing apparatus and testing method

Patent metadata

Field	Value
Publication number	US-12298340-B2
Application number	US-202318453946-A
Country	US
Kind code	B2
Filing date	Aug 22, 2023
Priority date	Oct 27, 2022
Publication date	May 13, 2025
Grant date	May 13, 2025

Abstract

A testing apparatus, including: a variable resistor coupled to a control electrode of a switching device; a storage circuit storing information indicating a relation between a resistance value of the variable resistor and a voltage change rate at which a voltage between power-source-side and ground-side electrodes of the switching device changes when the switching device is turned off; and a control circuit controlling the variable resistor. The control circuit sets the variable resistor to have a first resistance value and obtains a first value of the voltage change rate, sets the variable resistor to have a second resistance value based on the first value of the voltage change rate and the information, obtains a second value of the voltage change rate when the variable resistor is of the second resistance value, and determines whether the second value of the voltage change rate meets a specification of the switching device.

First claim

What is claimed is:

1. A testing apparatus for testing a switching device that is series-coupled to an inductor, and that has a control electrode, a power-source-side electrode, and a ground-side electrode, a predetermined voltage being applied to the inductor, the testing apparatus comprising:
a variable resistor coupled to the control electrode of the switching device;
a storage circuit configured to store first information indicating a relation between a resistance value of the variable resistor and a voltage change rate which is a rate at which a voltage between the power-source-side electrode and the ground-side electrode of the switching device changes when the switching device is turned off; and
a control circuit configured to control the variable resistor, and control on and off of the switching device, wherein
the control circuit is configured to:
set the resistance value of the variable resistor to a first resistance value and obtain a first value of the voltage change rate,
set the resistance value of the variable resistor to a second resistance value smaller than the first resistance value based on the first value of voltage change rate and the first information,
obtain a second value of the voltage change rate measured when the variable resistor is of the second resistance value, and
determine whether the second value of the voltage change rate meets a first specification of the switching device.

2. The testing apparatus according to claim 1 , wherein the control circuit
determines whether the first value of the voltage change rate meets the first specification, and
sets the resistance value of the variable resistor to the second resistance value when the first value of the voltage change rate does not meet the first specification.

3. The testing apparatus according to claim 1 , wherein
the first specification has a specification lower-limit value, and
the control circuit sets the resistance value of the variable resistor to the first resistance value, so that the first value of the voltage change rate is the specification lower-limit value of the first specification.

4. The testing apparatus according to claim 1 , wherein
the storage circuit further stores second information indicating a relation between
a peak value of a current flowing through the switching device when the switching device is turned off, and
a pulse width of a pulse signal for turning on the switching device, and

the control circuit is further configured to
set the pulse width to a first length and obtains a first peak value that is a first value of the peak value,
set the pulse width to a second length longer than the first length based on the first peak value and the second information,
obtains a second peak value that is a second value of the peak value measured when the pulse width is of the second length, and
determines whether the second peak value meets a second specification of the switching device.

5. The testing apparatus according to claim 4 , wherein the control circuit
determines whether the first peak value meets the second specification, and
sets the pulse width to the second length when the first peak value does not meet the second specification.

6. The testing apparatus according to claim 4 , wherein
the second specification has a specification lower-limit value, and
the control circuit sets the pulse width to the first length so that the first peak value is the specification lower-limit value of the second specification.

7. The testing apparatus according to claim 1 , further comprising:
a diode for current regeneration provided in parallel with the inductor.

8. A testing method for testing a switching device that is series-coupled to an inductor, and has a control electrode, a power-source-side electrode, and a ground-side electrode, a predetermined voltage being applied to the inductor, the testing method comprising:
setting a resistance value of the variable resistor coupled to a control electrode of the switching device to a first resistance value and obtaining a first value of a voltage change rate, the voltage change rate being a rate at which a voltage between the power-source-side electrode and the ground-side electrode of the switching device changes when the switching device is turned off,
setting the resistance value of the variable resistor to a second resistance value smaller than the first resistance value based on the first value of the voltage change rate and first information indicating a relation between a resistance value of the variable resistor and the voltage change rate,
obtaining a second value of the voltage change rate, when the variable resistor is of the second resistance value, and
determining whether the second value of the voltage change rate meets a first specification of the switching device.

9. The testing method according to claim 8 , comprising:
determining whether the first value of the voltage change rate meets the first specification, and
setting the resistance value of the variable resistor to the second resistance value when the first value of the voltage change rate does not meet the first specification.

10. The testing method according to claim 8 , wherein
the first specification has a specification lower-limit value, and
the testing method further includes setting the resistance value of the variable resistor to the first resistance value so that the first value of the voltage change rate is the specification lower-limit value of the first specification.

11. The testing method according to claim 8 , further comprising:
setting a pulse width of a pulse signal for turning on the switching device to a first length, and obtaining a first peak value, which is a first value of a peak value of a current flowing through the switching device when the switching device is turned off;
obtaining second information indicating a relation between the pulse width and the peak value of the current flowing through the switching device when the switching device is turned off; and
setting the pulse width to a second length longer than the first length based on the first peak value and the second information,
obtaining a second peak value, which is a second value of the peak value measured when the pulse width is of the second length, and
determining whether the second peak value meets a second specification of the switching device.

12. The testing method according to claim 11 , comprising:
determining whether the first peak value meets the second specification, and
setting the pulse width to the second length when the first peak value does not meet the second specification.

13. The testing method according to claim 11 , wherein
the second specification has a specification lower-limit value, and
the testing method further includes setting the pulse width to the first length so that the first peak value is the specification lower-limit value of the second specification.

14. The testing method according to claim 8 , further comprising:
providing a diode for current regeneration in parallel with the inductor.

Assignees

• Fuji Electric Co Ltd

Inventors

• Yoshida Mitsuru

Classifications

• G01R31/2603

  for curve tracing of semiconductor characteristics, e.g. on oscilloscope · CPC title

• G01R31/2642

  Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests · CPC title

• G01R31/2617 Primary

  for measuring switching properties thereof · CPC title

• G01R31/3277 Primary

  of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches · CPC title