Testing semiconductor components
US-11201065-B2 · Dec 14, 2021 · US
of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence)
of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence) · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01R31/129 |
| Official title | {of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence)} |
| Display label | of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence) |
| Total patents | 99 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 6 |
| 2016 | 7 |
| 2017 | 11 |
| 2018 | 7 |
| 2019 | 16 |
| 2020 | 8 |
| 2021 | 12 |
| 2022 | 8 |
| 2023 | 5 |
| 2024 | 7 |
| 2025 | 9 |
| 2026 | 3 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Time dependent dielectric breakdown test structure and test method thereof
US-11187740-B2 · Nov 30, 2021 · US
Testing semiconductor components
US-2021134610-A1 · May 6, 2021 · US
Insulating substrate inspecting method and inspecting apparatus
US-10996257-B2 · May 4, 2021 · US
Detection of an electric arc hazard related to a wafer
US-2021063461-A1 · Mar 4, 2021 · US
High-voltage isolator testing
US-10871514-B2 · Dec 22, 2020 · US
Integrated circuit having insulation breakdown detection
US-10753968-B2 · Aug 25, 2020 · US
Testing of semiconductor devices and devices, and designs thereof
US-10698022-B2 · Jun 30, 2020 · US
Detection of shoot-through in power converters
US-2020177069-A1 · Jun 4, 2020 · US
Time Dependent Dielectric Breakdown Test Structure and Test Method Thereof
US-2020141995-A1 · May 7, 2020 · US
Semiconductor device, method of testing semiconductor device and method of manufacturing semiconductor device
US-2020144138-A1 · May 7, 2020 · US
Load drive apparatus
US-10587263-B2 · Mar 10, 2020 · US
Dielectric breakdown monitor
US-10564213-B2 · Feb 18, 2020 · US
Insulating substrate inspecting method and inspecting apparatus
US-2019361067-A1 · Nov 28, 2019 · US
Stationary bath for testing electronic components
US-10481198-B2 · Nov 19, 2019 · US
Parallel test structure
US-10475677-B2 · Nov 12, 2019 · US
Diagnostic apparatus for switchgear
US-10444284-B2 · Oct 15, 2019 · US
Load drive apparatus
US-2019305772-A1 · Oct 3, 2019 · US
On-chip test circuit for magnetic random access memory (MRAM)
US-10416217-B2 · Sep 17, 2019 · US
Integrated circuit having insulation breakdown detection
US-2019265292-A1 · Aug 29, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01R31/129?
- CPC G01R31/129 is the Cooperative Patent Classification code for “of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence).”
- How many patents are filed under CPC G01R31/129 (of components or parts made of semiconducting materials; of LV components or parts (G01R31/18 takes precedence))?
- Our database includes 99 publications tagged with this CPC code.
- Is patent activity under CPC G01R31/129 growing?
- Publication counts under this code: 7 in 2024 vs 9 in 2025 (latest complete years).