Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-2023194567-A1 · Jun 22, 2023 · US
Calibration, e.g. of probes
Calibration, e.g. of probes · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q40/00 |
| Official title | Calibration, e.g. of probes |
| Display label | Calibration, e.g. of probes |
| Total patents | 75 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is rapidly growing.
| Year | Patents |
|---|---|
| 2015 | 14 |
| 2016 | 12 |
| 2017 | 3 |
| 2018 | 5 |
| 2019 | 7 |
| 2020 | 8 |
| 2021 | 2 |
| 2022 | 5 |
| 2023 | 8 |
| 2024 | 5 |
| 2025 | 6 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-11680963-B2 · Jun 20, 2023 · US
Three-dimensional surface metrology of wafers
US-11662324-B1 · May 30, 2023 · US
AFM imaging with real time drift correction
US-11604210-B2 · Mar 14, 2023 · US
Atomic force microscope using artificial intelligence object recognition technology and operation method thereof
US-2022373575-A1 · Nov 24, 2022 · US
Method for calibrating nano measurement scale and standard material used therein
US-2022187195-A1 · Jun 16, 2022 · US
System and method of performing scanning probe microscopy on a substrate surface
US-11320457-B2 · May 3, 2022 · US
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-2022107340-A1 · Apr 7, 2022 · US
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-11237187-B2 · Feb 1, 2022 · US
System and method of performing scanning probe microscopy on a substrate surface
US-2021318353-A1 · Oct 14, 2021 · US
Torsional and lateral stiffness measurement
US-10900878-B2 · Jan 26, 2021 · US
Data correction method, computer program for causing computer to perform data correction method, image processor, and scanning probe microscope
US-10846547-B2 · Nov 24, 2020 · US
Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product
US-10746702-B2 · Aug 18, 2020 · US
Method for estimating a stiffness of a deformable part
US-10718697-B2 · Jul 21, 2020 · US
Alignment system and method
US-10663874-B2 · May 26, 2020 · US
Method and apparatus for examining a measuring tip of a scanning probe microscope
US-2020141972-A1 · May 7, 2020 · US
Calibrating tip-enhanced Raman microscopes
US-10605826-B2 · Mar 31, 2020 · US
Determining interaction forces in a dynamic mode AFM during imaging
US-10578643-B2 · Mar 3, 2020 · US
Scanning probe microscope and surface image correction method
US-10564183-B2 · Feb 18, 2020 · US
Calibrating tip-enhanced raman microscopes
US-2019383854-A1 · Dec 19, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q40/00?
- CPC G01Q40/00 is the Cooperative Patent Classification code for “Calibration, e.g. of probes.”
- How many patents are filed under CPC G01Q40/00 (Calibration, e.g. of probes)?
- Our database includes 75 publications tagged with this CPC code.
- Is patent activity under CPC G01Q40/00 growing?
- Publication counts under this code: 5 in 2024 vs 6 in 2025 (latest complete years).