System and Method for Defect Detection and Photoluminescence Measurement of a Sample
US-2016377548-A1 · Dec 29, 2016 · US
Photoluminescence of semiconductors
Photoluminescence of semiconductors · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01N21/6489 |
| Official title | {Photoluminescence of semiconductors} |
| Display label | Photoluminescence of semiconductors |
| Total patents | 448 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is stable.
| Year | Patents |
|---|---|
| 2015 | 37 |
| 2016 | 36 |
| 2017 | 35 |
| 2018 | 41 |
| 2019 | 38 |
| 2020 | 44 |
| 2021 | 43 |
| 2022 | 34 |
| 2023 | 36 |
| 2024 | 45 |
| 2025 | 47 |
| 2026 | 12 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
A selective process for the detection of fluoride ions
US-2016363536-A1 · Dec 15, 2016 · US
Method and system for monitoring the quality of photovoltaic cells
US-2016322934-A1 · Nov 3, 2016 · US
Method for inspecting polysilicon layer
US-9464991-B2 · Oct 11, 2016 · US
Feed Forward of Metrology Data in a Metrology System
US-2016290796-A1 · Oct 6, 2016 · US
Real-time baseline correction technique for infrared time-resolved photoluminescence
US-2016282272-A1 · Sep 29, 2016 · US
Method for the Optical Characterization of an Optoelectronic Semiconductor Material and Device for Carrying Out the Method
US-2016282271-A1 · Sep 29, 2016 · US
Inspection apparatus and inspection method
US-9450536-B2 · Sep 20, 2016 · US
Infrared detector device inspection system
US-9410900-B2 · Aug 9, 2016 · US
Nanoparticle probes, methods, and systems for use thereof
US-9410934-B2 · Aug 9, 2016 · US
Methods and apparatus for spectral luminescence measurement
US-9410890-B2 · Aug 9, 2016 · US
Evaluation device for oxide semiconductor thin film
US-2016223462-A1 · Aug 4, 2016 · US
Luminescence imaging systems and methods for evaluating photovoltaic devices
US-2016218670-A1 · Jul 28, 2016 · US
Systems and Methods Related to Optical Nanosensors Comprising Photoluminescent Nanostructures
US-2016178597-A1 · Jun 23, 2016 · US
Spatial Positioning of Spectrally Labeled Beads
US-2016161398-A1 · Jun 9, 2016 · US
System and method for defect detection and photoluminescence measurement of a sample
US-9354177-B2 · May 31, 2016 · US
Apparatus for monitoring deposition rate, apparatus provided with the same for depositing organic layer, method of monitoring deposition rate, and method of manufacturing organic light emitting display apparatus using the same
US-9347886-B2 · May 24, 2016 · US
Linear inspection system
US-9341580-B2 · May 17, 2016 · US
Spatial positioning of spectrally labeled beads
US-9304084-B2 · Apr 5, 2016 · US
Spatial positioning of spectrally labeled beads
US-9297762-B2 · Mar 29, 2016 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01N21/6489?
- CPC G01N21/6489 is the Cooperative Patent Classification code for “Photoluminescence of semiconductors.”
- How many patents are filed under CPC G01N21/6489 (Photoluminescence of semiconductors)?
- Our database includes 448 publications tagged with this CPC code.
- Is patent activity under CPC G01N21/6489 growing?
- Publication counts under this code: 45 in 2024 vs 47 in 2025 (latest complete years).