Heat treatment method

US9422624B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9422624-B2
Application numberUS-201514603405-A
CountryUS
Kind codeB2
Filing dateJan 23, 2015
Priority dateJan 24, 2014
Publication dateAug 23, 2016
Grant dateAug 23, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

The present disclosure provides a heat treatment method, in which a substrate supporter supporting a plurality of substrates in the configuration of a shelf thereon is loaded in a vertical reaction tube surrounded by a heating mechanism and a heat treatment is performed. The method includes discharging a processing gas from a gas nozzle provided in the reaction tube to extend in a vertical direction of the substrate supporter, and supplying a temperature adjusting fluid into a flow path forming member provided to surround the gas nozzle in the reaction tube and adjusting a temperature of the processing gas in the gas nozzle.

First claim

Opening claim text (preview).

What is claimed is: 1. A heat treatment method, in which a substrate supporter supporting a plurality of substrates in the configuration of a shelf thereon is loaded in a vertical reaction tube surrounded by a heating mechanism and a heat treatment is performed, comprising: discharging a processing gas from a gas nozzle provided in the reaction tube to extend in a vertical direction of the substrate supporter; and supplying a temperature adjusting fluid into a flow path forming member provided to surround the gas nozzle in the reaction tube and adjusting a temperature of the processing gas in the gas nozzle. 2. The heat treatment method of claim 1 , wherein the temperature adjusting fluid is a temperature adjusting gas. 3. The heat treatment method of claim 1 , wherein the processing gas is a source gas for forming a film. 4. The heat treatment method of claim 3 , further comprising supplying a reaction gas reacting with the source gas into the reaction tube. 5. The heat treatment method of claim 3 , wherein the temperature adjusting fluid is a cooling fluid for cooling the processing gas. 6. The heat treatment method of claim 5 , wherein the heating mechanism is configured to include a plurality of heating units to respectively heat a plurality of regions arranged in the reaction tube in a vertical direction, the heat treatment method further comprising: loading the substrate supporter in the reaction tube; and adjusting a heating temperature in the reaction tube such that after the loading of the substrate supporter is terminated, a temperature of a lower region of the reaction tube among the plurality of regions is set to a first temperature higher than a temperature of an upper region relative to the lower region and not less than a thermal decomposition temperature of the processing gas, wherein adjusting the temperature of the processing gas includes adjusting at least one of the temperature and the flow rate of the temperature adjusting fluid such that the temperature of the processing gas in the gas nozzle is lowered below the thermal decomposition temperature of the processing gas by the flow of the temperature adjusting fluid. 7. The heat treatment method of claim 6 , further comprising lowering the temperature of the lower region of the reaction tube to a second temperature lower than the first temperature after the temperature of the lower region of the reaction tube is set to the first temperature, wherein discharging the processing gas includes initiating the supply of the processing gas before the temperature of the lower region of the reaction tube is lowered to the second temperature, after the temperature of the lower region of the reaction tube is set to the first temperature. 8. The heat treatment method of claim 5 , wherein when the heat treatment is performed on the substrates, an atmosphere in the reaction tube is set to a temperature not less than the thermal decomposition temperature of the processing gas, wherein adjusting the temperature of the processing gas includes maintaining an interior of the gas nozzle at a temperature not higher than the thermal decomposition temperature of the processing gas. 9. The heat treatment method of claim 5 , after discharging the processing gas, further comprising reducing a supply flow rate of the temperature adjusting fluid. 10. The heat treatment method of claim 3 , wherein the processing gas is a metal-containing organic gas. 11. A non-transitory storage medium configured to store a computer program operating on a computer, wherein the computer program includes a group of steps for performing the heat treatment method according to claim 1 .

Assignees

Inventors

Classifications

  • Elongated nozzles, tubes with holes · CPC title

  • Cooled nozzles · CPC title

  • specially adapted for a substrate stack in the ALD reactor · CPC title

  • Reduction of impurities in the source gas · CPC title

  • C23C16/46Primary

    characterised by the method used for heating the substrate (C23C16/48, C23C16/50 take precedence) · CPC title

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What does patent US9422624B2 cover?
The present disclosure provides a heat treatment method, in which a substrate supporter supporting a plurality of substrates in the configuration of a shelf thereon is loaded in a vertical reaction tube surrounded by a heating mechanism and a heat treatment is performed. The method includes discharging a processing gas from a gas nozzle provided in the reaction tube to extend in a vertical dire…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification C23C16/4402. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Aug 23 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).