Semiconductor device
US-2024363707-A1 · Oct 31, 2024 · US
US9418834B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9418834-B2 |
| Application number | US-201414570865-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 15, 2014 |
| Priority date | Dec 17, 2013 |
| Publication date | Aug 16, 2016 |
| Grant date | Aug 16, 2016 |
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This disclosure relates to a processing system for spin-coating a substrate with Molecular Self-assembly (MSA) chemicals to form photoresist films and/or low dielectric constant (low-k) films on the substrate. The spin-coating processing system may include a spin-coating chamber that can receive and spin-coat MSA chemicals onto the substrate and an annealing chamber to thermally treat the substrate after the spin-coat process. In certain embodiments, the spin-coating processing system may also pre-treat or pre-wet the substrate prior to the spin-coating process.
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What is claimed is: 1. A method for treating a substrate, comprising: receiving the substrate in a chemical dispensing system, the substrate comprising an hydroxide layer on a surface of the substrate; dispensing a first solvent solution to pre-wet the surface, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate, after dispensing the first solvent solution, around a center region of the substrate; dispensing a patterning chemical onto the pre-wet surface while rotating the substrate, the patterning chemical comprising: a carbon compound; a bonding compound coupled to the carbon compound; a terminal compound coupled to the carbon compound that is opposite the bonding compound; a second solvent solution; annealing the substrate following the dispensing of the pattern chemical on the substrate. 2. The method of claim 1 , wherein the bonding compound comprises a Si x O y molecule, the carbon compound comprises a C x H y molecule, and the terminal compound comprises an amino group (NHx). 3. The method of claim 1 , further comprising: prebaking the substrate prior to dispensing the first solvent; or chilling the substrate prior to dispensing the first solvent. 4. The method of claim 1 , wherein the dispensing of the patterning chemical comprises an amount to bond with more than a majority of the hydroxide layer. 5. The method of claim 1 , wherein the patterning chemical comprises less than 0.5 mM of the carbon compound, bonding compound, and the terminal compound. 6. The method of claim 1 , wherein the first solvent comprises propylene glycol monomethyl ether acetate (PGMEA), and the second solvent solution comprises PGMEA. 7. The method of claim 1 , wherein the first solvent comprises propylene glycol monomethyl ether acetate (PGMEA), and the second solvent solution comprises water no more than 2% by weight. 8. The method of claim 1 , wherein the annealing comprises a temperature no more than 250C. 9. The method of claim 8 , wherein the annealing comprises a time of no more than 5 minutes. 10. The method of claim 8 , wherein the annealing comprises a time of about 5 minutes. 11. The method of claim 1 , wherein the rotating comprises a rotation speed of no more than 2200 rpm. 12. The method of claim 1 , wherein the rotating comprises a rotation speed of no less than 800 rpm. 13. The method of claim 1 , wherein the rotating comprises a rotation speed of about 2000 rpm. 14. The method of claim 1 , wherein the rotating comprises a rotation speed of about 1000 rpm. 15. The method of claim 1 , wherein the amount of water comprises no more than 2% by weight. 16. The method of claim 1 , wherein the patterning chemical comprises Diethyleneamine. 17. A method for treating a substrate, comprising: receiving the substrate in a spin-coating system, the substrate comprising a barrier layer comprising Tantalum; dispensing a first solvent solution to pre-wet the surface of the substrate, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate around a center region of the substrate; dispensing an organosilicate, using the spin-coating system, onto the pre-wet surface; forming a dielectric layer on the substrate using the organosilicate; and applying a metal layer to the dielectric layer. 18. The method of claim 17 , wherein the rotating comprises a rotation speed of no less than 800 rpm. 19. The method of claim 17 , wherein the annealing comprises a temperature no more than 250C. 20. A method for treating a substrate, comprising: receiving the substrate in a spin-coating system, the substrate comprising an hydroxide layer on a surface of the substrate; dispensing a first solvent solution to pre-wet the surface in the spin-coating system, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate, after dispensing the first solvent solution, around a center region of the substrate; and dispensing a organosilicate onto the pre-wet surface while rotating the substrate in the spin-coating system.
Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass · CPC title
to change the surface groups of the insulating materials · CPC title
by exposure to a liquid · CPC title
the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC · CPC title
Electricity · mapped topic
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