System and methods for spin-on coating of self-assembled monolayers or periodic organosilicates on a substrate

US9418834B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9418834-B2
Application numberUS-201414570865-A
CountryUS
Kind codeB2
Filing dateDec 15, 2014
Priority dateDec 17, 2013
Publication dateAug 16, 2016
Grant dateAug 16, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

This disclosure relates to a processing system for spin-coating a substrate with Molecular Self-assembly (MSA) chemicals to form photoresist films and/or low dielectric constant (low-k) films on the substrate. The spin-coating processing system may include a spin-coating chamber that can receive and spin-coat MSA chemicals onto the substrate and an annealing chamber to thermally treat the substrate after the spin-coat process. In certain embodiments, the spin-coating processing system may also pre-treat or pre-wet the substrate prior to the spin-coating process.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for treating a substrate, comprising: receiving the substrate in a chemical dispensing system, the substrate comprising an hydroxide layer on a surface of the substrate; dispensing a first solvent solution to pre-wet the surface, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate, after dispensing the first solvent solution, around a center region of the substrate; dispensing a patterning chemical onto the pre-wet surface while rotating the substrate, the patterning chemical comprising: a carbon compound; a bonding compound coupled to the carbon compound; a terminal compound coupled to the carbon compound that is opposite the bonding compound; a second solvent solution; annealing the substrate following the dispensing of the pattern chemical on the substrate. 2. The method of claim 1 , wherein the bonding compound comprises a Si x O y molecule, the carbon compound comprises a C x H y molecule, and the terminal compound comprises an amino group (NHx). 3. The method of claim 1 , further comprising: prebaking the substrate prior to dispensing the first solvent; or chilling the substrate prior to dispensing the first solvent. 4. The method of claim 1 , wherein the dispensing of the patterning chemical comprises an amount to bond with more than a majority of the hydroxide layer. 5. The method of claim 1 , wherein the patterning chemical comprises less than 0.5 mM of the carbon compound, bonding compound, and the terminal compound. 6. The method of claim 1 , wherein the first solvent comprises propylene glycol monomethyl ether acetate (PGMEA), and the second solvent solution comprises PGMEA. 7. The method of claim 1 , wherein the first solvent comprises propylene glycol monomethyl ether acetate (PGMEA), and the second solvent solution comprises water no more than 2% by weight. 8. The method of claim 1 , wherein the annealing comprises a temperature no more than 250C. 9. The method of claim 8 , wherein the annealing comprises a time of no more than 5 minutes. 10. The method of claim 8 , wherein the annealing comprises a time of about 5 minutes. 11. The method of claim 1 , wherein the rotating comprises a rotation speed of no more than 2200 rpm. 12. The method of claim 1 , wherein the rotating comprises a rotation speed of no less than 800 rpm. 13. The method of claim 1 , wherein the rotating comprises a rotation speed of about 2000 rpm. 14. The method of claim 1 , wherein the rotating comprises a rotation speed of about 1000 rpm. 15. The method of claim 1 , wherein the amount of water comprises no more than 2% by weight. 16. The method of claim 1 , wherein the patterning chemical comprises Diethyleneamine. 17. A method for treating a substrate, comprising: receiving the substrate in a spin-coating system, the substrate comprising a barrier layer comprising Tantalum; dispensing a first solvent solution to pre-wet the surface of the substrate, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate around a center region of the substrate; dispensing an organosilicate, using the spin-coating system, onto the pre-wet surface; forming a dielectric layer on the substrate using the organosilicate; and applying a metal layer to the dielectric layer. 18. The method of claim 17 , wherein the rotating comprises a rotation speed of no less than 800 rpm. 19. The method of claim 17 , wherein the annealing comprises a temperature no more than 250C. 20. A method for treating a substrate, comprising: receiving the substrate in a spin-coating system, the substrate comprising an hydroxide layer on a surface of the substrate; dispensing a first solvent solution to pre-wet the surface in the spin-coating system, the first solvent solution comprising an amount of water no more than 10% by weight; rotating the substrate, after dispensing the first solvent solution, around a center region of the substrate; and dispensing a organosilicate onto the pre-wet surface while rotating the substrate in the spin-coating system.

Assignees

Inventors

Classifications

  • Generic processes or apparatus for manufacture or treatments not covered by the other groups of this subclass · CPC title

  • to change the surface groups of the insulating materials · CPC title

  • by exposure to a liquid · CPC title

  • the material containing Si, O and at least one of H, N, C, F or other non-metal elements, e.g. SiOC, SiOC:H or SiONC · CPC title

  • Electricity · mapped topic

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Frequently asked questions

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What does patent US9418834B2 cover?
This disclosure relates to a processing system for spin-coating a substrate with Molecular Self-assembly (MSA) chemicals to form photoresist films and/or low dielectric constant (low-k) films on the substrate. The spin-coating processing system may include a spin-coating chamber that can receive and spin-coat MSA chemicals onto the substrate and an annealing chamber to thermally treat the subst…
Who is the assignee on this patent?
Tokyo Electron Ltd
What technology area does this patent fall under?
Primary CPC classification H10P14/6534. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Aug 16 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).