Metal wiring layer forming method, metal wiring layer forming apparatus, and recording medium
US-2016240436-A1 · Aug 18, 2016 · US
US2021213707A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2021213707-A1 |
| Application number | US-202117213527-A |
| Country | US |
| Kind code | A1 |
| Filing date | Mar 26, 2021 |
| Priority date | Oct 2, 2018 |
| Publication date | Jul 15, 2021 |
| Grant date | — |
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A heteroepitaxial structure includes a first metal portion having a polycrystalline structure, a second metal portion on the first metal portion, the second metal portion has an island-shaped structure on the first metal portion, the second metal portion is provided corresponding to at least one crystalline grain exposed to a surface of the first metal portion, and the second metal portion and the at least one crystalline grain have a heteroepitaxial interface.
Opening claim text (preview).
What is claimed is: 1 . A heteroepitaxial structure, comprising: a first metal portion having a polycrystalline structure; a second metal portion on the first metal portion; the second metal portion has an island-shaped structure on the first metal portion; the second metal portion is provided corresponding to at least one crystalline grain exposed to a surface of the first metal portion; and the second metal portion and the at least one crystalline grain have a heteroepitaxial interface. 2 . The heteroepitaxial structure according to claim 1 , wherein the first metal portion comprises a metal element selected from platinum (Pt), palladium (Pd), rhodium (Rd), ruthenium (Ru), osmium (Os) and iridium (Ir), and the second metal portion is gold (Au). 3 . The heteroepitaxial structure according to claim 1 , wherein the first metal portion is palladium (Pd), the second metal portion is gold (Au), and the interface between the first metal portion and the second metal portion includes a solid solution of the first metal portion and the second metal portion. 4 . The heteroepitaxial structure according to claim 1 , wherein the island-shaped structure is a mountain shape or a hemispherical shape. 5 . A method for forming heteroepitaxial structure, the method comprising: dipping a first metal portion having a polycrystalline structure in an electroless plating solution containing a metal ion of a second metal different from the first metal portion, an ion of a halogen element as an oxidizing agent, and a reducing agent; and heteroepitaxial growing a metal reduced from a metal ion of the second metal by a surface limited redox replacement corresponding to a reduced surface of at least one crystalline grain of the first metal portion while reducing the surface of the first metal portion by the oxidizing agent and the reducing agent. 6 . The method for forming heteroepitaxial structure according to claim 5 , wherein forming a heteroepitaxial interface with the at least one crystalline grain by heteroepitaxial growth, and forming a second metal portion having an island-shaped structure on a surface of the first metal portion. 7 . The method for forming heteroepitaxial structure according to claim 5 , wherein the first metal portion is platinum, the metal ion is gold ion (Au + , Au 3+ ), the ion of the halogen element is iodine ion (I − , I 3 − ), and the reducing agent is L(+)-ascorbic acid (C 6 H 8 O 8 ). 8 . The method for forming heteroepitaxial structure according to claim 5 , wherein the electroless plating solution is diluted 500 times or more with water. 9 . The method for forming heteroepitaxial structure according to claim 7 , wherein dipping the first metal portion in iodine tincture and L(+)-ascorbic acid (C 6 H 8 O 6 ) before dipping in the electroless plating solution. 10 . A nanogap electrode, comprising: a first electrode and a second electrode each including a first metal portion and a second metal portion on the first metal portion, the first metal portion having a polycrystalline structure, wherein the first metal portion has a linear pattern having a width of 20 nm or less, the second metal portion is disposed at least on one end of the linear pattern of the first metal portion and has an island-shaped structure, a heteroepitaxial interface is formed corresponding to at least one crystalline grain exposed to a surface of the first metal portion, and a distance between the second metal portions on the first electrode and on the second electrode is 5 nm or less. 11 . The nanogap electrode according to claim 10 , wherein the second metal portion includes a plurality of crystal regions having different crystal orientations. 12 . The nanogap electrode according to claim 10 , wherein the second metal portion has a hemispherical shape. 13 . The nanogap electrode according to claim 10 , wherein the first metal portion comprises a metal element selected from platinum (Pt), palladium (Pd), rhodium (Rd), ruthenium (Ru), osmium (Os) and iridium (Ir), and the second metal portion is gold (Au). 14 . The nanogap electrode according to claim 10 , wherein the first metal portion is palladium (Pd), the second metal portion is gold (Au), and an interface between the first metal portion and the second metal portion includes a solid solution of the first metal portion and the second metal portion. 15 . The nanogap electrode according to claim 10 , wherein the second metal portion is disposed at one end on a substantially central axis of the linear pattern of the first metal portion. 16 . The nanogap electrode according to claim 10 , wherein the first metal portion has a linear pattern having a width of 15 nm or less.
metallic substrate · CPC title
Coating with metallic material characterised only by the composition of the metallic material, i.e. not characterised by the coating process (C23C26/00, C23C28/00 take precedence) · CPC title
only coatings {only including layers} of metallic material · CPC title
using reducing agents · CPC title
Two or more layers only obtained by electroless plating · CPC title
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