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Method and Apparatus of Tuning a Scanning Probe Microscope
US2016109477A1 · US · A1
| Field | Value |
|---|---|
| Publication number | US-2016109477-A1 |
| Application number | US-201514834061-A |
| Country | US |
| Kind code | A1 |
| Filing date | Aug 24, 2015 |
| Priority date | Nov 11, 2011 |
| Publication date | Apr 21, 2016 |
| Grant date | — |
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- Title
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Abstract
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An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
First claim
Opening claim text (preview).
We claim: 1 . A method of operating a scanning probe microscope (SPM) comprising: tuning the SPM to determine an operating frequency of a drive of the SPM by plotting thermal data having a thermal peak on top of a conventional tuning curve; and wherein the tuning curve has two peaks separated by a valley, and wherein the operating frequency is at about a midpoint on a downslope of the valley corresponding to the thermal peak.
Assignees
Inventors
Classifications
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes · CPC title
- G01Q30/04Primary
Display or data processing devices · CPC title
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices · CPC title
Tapping mode · CPC title
Calibration, e.g. of probes · CPC title
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- What does patent US2016109477A1 cover?
- An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not selected based on a peak of the amplitude response of the probe when swept over a range of frequencies; rather, the operating frequency is selected using only peak data corresponding to a TIDPS curve.
- Who is the assignee on this patent?
- Bruker Nano Inc
- What technology area does this patent fall under?
- Primary CPC classification G01Q30/04. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Thu Apr 21 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (A1). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).