Probe-Based Instrument and Method Using Torsional Oscillation Sensing
US-2025277809-A1 · Sep 4, 2025 · US
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Pittenger Bede patents
Pittenger Bede is listed as an inventor on 21 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Pittenger Bede |
| Total patents | 21 |
| First publication | Mar 31, 2015 |
| Latest publication | Sep 4, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
US-2025147066-A1 · May 8, 2025 · US
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US-12241911-B2 · Mar 4, 2025 · US
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
US-2024175895-A1 · May 30, 2024 · US
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US-11940461-B2 · Mar 26, 2024 · US
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
US-2023243867-A1 · Aug 3, 2023 · US
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US-11635449-B2 · Apr 25, 2023 · US
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
US-2022252638-A1 · Aug 11, 2022 · US
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US-11307220-B2 · Apr 19, 2022 · US
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
US-2021239732-A1 · Aug 5, 2021 · US
Recent patents
Latest publications not already listed above.
Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
US-11029330-B2 · Jun 8, 2021 · US
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
US-2020041541-A1 · Feb 6, 2020 · US
Force Measurement with Real-Time Baseline Determination
US-2018299479-A1 · Oct 18, 2018 · US
Force measurement with real-time baseline determination
US-9910064-B2 · Mar 6, 2018 · US
Force Measurement with Real-Time Baseline Determination
US-2017227577-A1 · Aug 10, 2017 · US
Force measurement with real-time baseline determination
US-9575090-B2 · Feb 21, 2017 · US
Method and Apparatus of Tuning a Scanning Probe Microscope
US-2016109477-A1 · Apr 21, 2016 · US
Method and apparatus of tuning a scanning probe microscope
US-9116167-B2 · Aug 25, 2015 · US
Method and apparatus of tuning a scanning probe microscope
US-2015204902-A1 · Jul 23, 2015 · US
Force Measurement with Real-Time Baseline Determination
US-2015160259-A1 · Jun 11, 2015 · US
Method and apparatus of tuning a scanning probe microscope
US-8997259-B2 · Mar 31, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Bruker Nano Inc | 21 |
| Bruker Nano | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01Q30/06 | 16 |
| G01Q10/06 | 16 |
| G01Q10/065 | 16 |
| B82Y35/00 | 15 |
| G01Q30/04 | 15 |