Discrete three-dimensional processor

US11960987B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11960987-B2
Application numberUS-202318096013-A
CountryUS
Kind codeB2
Filing dateJan 12, 2023
Priority dateDec 10, 2018
Publication dateApr 16, 2024
Grant dateApr 16, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A discrete three-dimensional (3-D) processor a plurality of storage-processing units (SPU's), each of which comprises a non-memory circuit and more than one 3-D memory (3D-M) array. The preferred 3-D processor further comprises communicatively coupled first and second dice. The first die comprises the 3D-M arrays and the in-die peripheral-circuit components thereof; whereas, the second die comprises the non-memory circuits and off-die peripheral-circuit components of the 3D-M arrays.

First claim

Opening claim text (preview).

What is claimed is: 1. A discrete three-dimensional (3-D) processor, comprising: a plurality of storage-processing units (SPU's), each of said SPU's comprising a non-memory circuit and more than one 3-D memory (3D-M) array; a first die on a first semiconductor substrate, wherein said 3D-M array comprises memory cells stacked above said first semiconductor substrate, and an in-die peripheral-circuit component of said 3D-M array is disposed on said first semiconductor substrate; a second die on a second semiconductor substrate, wherein at least a portion of said non-memory circuit and an off-die peripheral-circuit component of said 3D-M array are disposed on said second semiconductor substrate; wherein, said non-memory circuit is not a part of a memory; said first die does not comprise said off-die peripheral-circuit component; said first and second dice are communicatively coupled by a plurality of inter-die connections; said first and second semiconductor substrates are separate semiconductor substrates. 2. The 3-D processor according to claim 1 , wherein: each of said SPU's comprises at least four 3D-M arrays including said 3D-M arrays; or, each of said SPU's comprises at least eight 3D-M arrays including said 3D-M arrays; or, said 3D-M array comprises a plurality of vertically stacked memory cells without any semiconductor substrate therebetween; or, said 3D-M array is a 3-D random-access memory (3D-RAM) array; or, said 3D-M array is a 3-D read-only memory (3D-ROM) array; or, said 3D-M array is a non-volatile memory (NVM) array; or, said 3D-M array is a 3-D writable memory (3D-W) array; or, said 3D-M array is a 3-D printed memory (3D-P) array; or said 3D-M array is a horizontal 3D-M (3D-MH) array; or, said 3D-M array is a vertical 3D-M (3D-Mv) array; or said 3D-M array is a 3D-static random access memory (3D-SRAM), 3D-dynamic random access memory (3D-DRAM), 3D-resistive random access memory (3D-RRAM), 3D-magnetoresistive random access memory (3D-MRAM), or 3D-ferroelectric random access memory (3D-FeRAM) array; or, said 3D-M array is a 3D-mask programmable read-only memory (3D-MPROM), 3D-one-time-programmable (3D-OTP), 3D-multi-time-programmable (3D-MTP), 3D-erasable programmable read-only memory (3D-EPROM), 3D-electrically erasable programmable read-only memory (3D-EEPROM), 3D-flash, 3D-NOR, 3D-NAND, or 3D-XPoint array. 3. The 3-D processor according to claim 2 , wherein: a first number of the back-end-of-line (BEOL) layers of said first die is larger than a second number of the BEOL layers of said second die; or, a third number of the address-line layers of said first die is at least twice as much as a fourth number of the interconnect layers of said second die; or, a fifth number of the memory cells on each memory string in said first die is at least twice as much as a sixth number of the interconnect layers of said second die; or, a seventh number of the interconnect layers in the substrate circuit of said first die is smaller than an eighth number of the interconnect layers of said second die; or, the interconnect material used in said second die has a lower resistivity than the interconnect material used the substrate circuit of said first die. 4. The 3-D processor according to claim 3 , wherein: said non-memory circuit is a logic circuit; or, said non-memory circuit is a processing circuit; or, said 3D-M array stores at least a portion of a look-up table (LUT) of a non-arithmetic function/model; said non-memory circuit comprises an arithmetic logic circuit (ALC) for performing arithmetic operations on selected data from said LUT; whereby said 3-D processor computes said non-arithmetic function/model, wherein said non-arithmetic function/model includes more operations than the arithmetic operations provided by said ALC; or, said 3D-M array is a portion of a configurable computing element (CCE) and stores at least a portion of a look-up table (LUT) of a non-arithmetic function; said non-memory circuit comprises at least a configurable logic element (CLE) and/or a configurable interconnect (CIT); whereby said 3-D processor customizes said non-arithmetic function by programming said CCE and said CLE/CIT, wherein said non-arithmetic function includes more operations than the arithmetic operations provided by said CLE; or, said 3-D processor further comprises an input for transferring at least a first portion of a first pattern; said 3D-M array stores at least a second portion of a second pattern; said non-memory circuit comprises a pattern-processing circuit for performing pattern processing for said first and second patterns; or, said 3-D processor is a discrete 3-D processor with embedded search-pattern library, further comprising an input for transferring at least a target pattern; said 3D-M array stores at least a search pattern; said non-memory circuit comprises a pattern-processing circuit for searching said target pattern for said search pattern; or, said 3-D processor is a discrete 3-D storage with in-situ pattern-processing capabilities, further comprising an input for transferring at least a search pattern; said 3D-M array stores at least a target pattern; said non-memory circuit comprises a pattern-processing circuit for searching said target pattern for said search pattern; or, said 3D-M array stores at least a portion of a synaptic weight; said non-memory circuit comprises a neuro-processing circuit for performing neural processing with said synaptic weight. 5. The 3-D processor according to claim 3 , wherein: said off-die peripheral-circuit component comprises at least a portion of an address decoder; or, said off-die peripheral-circuit component comprises at least a portion of a sense amplifier; or, said off-die peripheral-circuit component comprises at least a portion of a programming circuit; or, said off-die peripheral-circuit component comprises at least a portion of a read-voltage generator; or, said off-die peripheral-circuit component comprises at least a portion of a write-voltage generator; or, said off-die peripheral-circuit component comprises at least a portion of a data buffer. 6. The 3-D processor according to claim 4 , wherein: said off-die peripheral-circuit component comprises at least a portion of an address decoder; or, said off-die peripheral-circuit component comprises at least a portion of a sense amplifier; or, said off-die peripheral-circuit component comprises at least a portion of a programming circuit; or, said off-die peripheral-circuit component comprises at least a portion of a read-voltage generator; or, said off-die peripheral-circuit component comprises at least a portion of a write-voltage generator; or, said off-die peripheral-circuit component comprises at least a portion of a data buffer. 7. The 3-D processor according to claim 3 , wherein: said first and second dice are vertically stacked; or, said first and second dice are face-to-face bonded; or, said first and second dice have a same die size; or, a first edge of said first die is aligned with a second edge of said second die; or, the projection of said 3D-M array on said second die at least partially overlaps said non-memory circuit; or, each 3D-M array is vertically aligned and communicatively coupled with a non-memory circuit; or, each non-memory circuit is vertically aligned and communicatively coupled with at least a 3D-M array; or, the pitch of said non-memory circuit is an integer multiple of the pitch of said 3D-M array; or, said inter-die connections include bond wires, micro-bumps, through-silicon-vias (TSV's), and/or vertical interconnect access (VIA's). 8. The 3-D processor according to claim 7 , wherein: said non-memory circuit is a logic circuit; or, said non-m

Assignees

Inventors

Classifications

  • Subject matter not provided for in other groups of this subclass · CPC title

  • Direct bonding of chips, wafers or substrates · CPC title

  • between multiple chips · CPC title

  • between stacked chips · CPC title

  • between stacked chips · CPC title

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What does patent US11960987B2 cover?
A discrete three-dimensional (3-D) processor a plurality of storage-processing units (SPU's), each of which comprises a non-memory circuit and more than one 3-D memory (3D-M) array. The preferred 3-D processor further comprises communicatively coupled first and second dice. The first die comprises the 3D-M arrays and the in-die peripheral-circuit components thereof; whereas, the second die comp…
Who is the assignee on this patent?
Zhang Guobiao, Hangzhou Haicun Information Tech Co Ltd
What technology area does this patent fall under?
Primary CPC classification G06N3/063. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 16 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).