Memory device and in-memory search method thereof
US-2024274164-A1 · Aug 15, 2024 · US
US9305605B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9305605-B2 |
| Application number | US-201514884760-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 15, 2015 |
| Priority date | Sep 1, 2011 |
| Publication date | Apr 5, 2016 |
| Grant date | Apr 5, 2016 |
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Official abstract text for this publication.
The present invention discloses a discrete three-dimensional vertical memory (3D-M V ). It comprises at least a 3D-array die and at least a peripheral-circuit die. The 3D-array die comprises a plurality of vertical memory strings. At least an off-die peripheral-circuit component of the 3D-M V arrays is located on the peripheral-circuit die instead of the 3D-array die. The 3D-array die and the peripheral-circuit die have substantially different back-end-of-line (BEOL) structures.
Opening claim text (preview).
What is claimed is: 1. A discrete three-dimensional vertical memory (3D-M V ), comprising: a 3D-array die comprising at least a 3D-M V array, wherein said 3D-M V array comprises a plurality of vertical memory strings, each of said vertical memory strings comprising a plurality of vertically stacked memory cells; a peripheral-circuit die comprising at least an off-die peripheral-circuit component of said 3D-M V array, wherein said off-die peripheral-circuit component is absent from said 3D-array die; means for coupling said 3D-array die and said peripheral-circuit die; wherein the number of memory cells on each of said vertical memory strings in said 3D-array die is at least twice as much as the number of interconnect levels in said peripheral-circuit die; and, said 3D-array die and said peripheral-circuit die are separate dice. 2. The memory according to claim 1 , wherein said 3D-M V is a vertical-NAND, a three-dimensional read-only memory (3D-ROM), or a three-dimensional random-access memory (3D-RAM). 3. The memory according to claim 1 , wherein said 3D-array die and said peripheral-circuit die are located in a memory package, a memory module, a memory card, or a solid-state drive. 4. The memory according to claim 1 , further comprising another 3D-array die including at least another 3D-M V array, wherein said peripheral-circuit die comprises at least another portion of another off-die peripheral-circuit component for said another 3D-array die. 5. The memory according to claim 1 , wherein said off-die peripheral-circuit component is a read-voltage generator and/or a write-voltage generator. 6. The memory according to claim 1 , wherein said off-die peripheral-circuit component is an address translator and/or a data translator.
Word line organisation; Word line lay-out · CPC title
Three dimensional array · CPC title
Arrangements for writing information into, or reading information out from, a digital store (G11C5/00 takes precedence; auxiliary circuits for stores using semiconductor devices G11C11/4063, G11C11/413) · CPC title
Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor (G11C5/141 takes precedence) · CPC title
using resistive RAM [RRAM] elements · CPC title
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