Methods for manufacturing semiconductor device

US11949040B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11949040-B2
Application numberUS-202217725732-A
CountryUS
Kind codeB2
Filing dateApr 21, 2022
Priority dateAug 1, 2017
Publication dateApr 2, 2024
Grant dateApr 2, 2024

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for manufacturing a semiconductor device is provided. The method includes forming a plurality of diodes on a first substrate and forming a first pattern array on a second substrate. The method also includes transferring the plurality of diodes from the first substrate to the second substrate. The method further includes forming the first pattern array on a third substrate. In addition, the method includes transferring the plurality of diodes from the second substrate to the third substrate. The method also includes forming a second pattern array on a fourth substrate. The method further includes transferring the plurality of diodes from the third substrate to the fourth substrate. The pitch between the plurality of diodes on the first substrate is different from the pitch of the first pattern array.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for manufacturing a semiconductor device, comprising: forming a plurality of diodes on a first substrate; forming a first pattern array on a second substrate; transferring the plurality of diodes from the first substrate to the second substrate; forming the first pattern array on a third substrate; transferring the plurality of diodes from the second substrate to the third substrate; forming a second pattern array on a fourth substrate; and transferring the plurality of diodes from the third substrate to the fourth substrate, wherein during transferring the plurality of diodes from the third substrate to the fourth substrate, spacer layers on the third substrate are aligned with plurality of spacer layers on the fourth substrate and plurality of non-aligned spacer layers on the fourth substrate are in between aligned plurality of spacer layers on the fourth substrate and at least one of the plurality of diodes is transferred between plurality of non-aligned spacer layers on the fourth substrate, wherein a pitch between the plurality of diodes on the first substrate is different from a pitch of the first pattern array. 2. The method as claimed in claim 1 , wherein the pitch of the first pattern array is n times larger than a pitch of the second pattern array, and wherein n is a positive integer. 3. The method as claimed in claim 1 , wherein the first pattern array comprises an adhesive layer. 4. The method as claimed in claim 1 , wherein a material of the second substrate is conductive. 5. The method as claimed in claim 1 , wherein a material of the third substrate is conductive.

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What does patent US11949040B2 cover?
A method for manufacturing a semiconductor device is provided. The method includes forming a plurality of diodes on a first substrate and forming a first pattern array on a second substrate. The method also includes transferring the plurality of diodes from the first substrate to the second substrate. The method further includes forming the first pattern array on a third substrate. In addition,…
Who is the assignee on this patent?
Innolux Corp
What technology area does this patent fall under?
Primary CPC classification H10H20/01. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Apr 02 2024 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).