Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets

Patent metadata

Field	Value
Publication number	US-11898971-B2
Application number	US-202017622535-A
Country	US
Kind code	B2
Filing date	Jun 24, 2020
Priority date	Jun 24, 2019
Publication date	Feb 13, 2024
Grant date	Feb 13, 2024

Abstract

A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

First claim

The invention claimed is:

1. A device for determining the material properties of a polycrystalline product during a production or a quality control of the polycrystalline product by means of an X-ray diffraction, comprising:
at least one X-ray source;
at least one X-ray detector; and
an X-ray mirror comprising a rotationally symmetrical support body, with a central opening and an inner circumferential surface defined by the central opening;
wherein an X-ray generated by the at least one X-ray source can be emitted onto a surface of the polycrystalline product by means of the X-ray mirror, and a resulting diffraction image of the X-ray can be detected by the at least one X-ray detector, wherein the X-ray generated by the at least one X-ray source can be guided through the X-ray mirror,
wherein a mirror surface is formed on the inner circumferential surface of the rotationally symmetrical support body, and the X-ray is both monochromatized and focused by the X-ray mirror in a direction of the polycrystalline product or in a direction of the polycrystalline product and the at least one X-ray detector,
wherein the at least one X-ray detector is designed in a form of a surface detector, and
wherein the polycrystalline product is a metallic product.

2. The device according to claim 1 , wherein the rotationally symmetrical support body is toroidal or annular in a cross-section.

3. The device according to claim 2 , wherein the mirror surface of the X-ray mirror is spherically curved or cylindrical with respect to a central axis from which the X-ray is emitted by the at least one X-ray source.

4. The device according to claim 2 , wherein the mirror surface of the X-ray mirror consists of highly oriented graphite crystals.

5. The device according to claim 4 , wherein the highly oriented graphite crystals are attached to the inner circumferential surface of the rotationally symmetrical support body in a form of a foil-like coating.

6. The device according to claim 4 , wherein the highly oriented graphite crystals are applied physically or chemically to the inner circumferential surface of the rotationally symmetrical support body.

7. The device according to claim 4 , wherein each of the highly oriented graphite crystals consists of crystallographically highly oriented pyrolytic graphite crystals.

8. The device according to claim 1 , further comprising:
a first blocking body, which is arranged between the at least one X-ray source and the X-ray mirror,
wherein a part of the X-ray is shaded after exiting the at least one X-ray source.

9. The device according to claim 8 , wherein the first blocking body is plate-shaped, and a surface extension of the first blocking body is aligned orthogonally to a central axis from which the X-ray is emitted by the at least one X-ray source.

10. The device according to claim 8 , wherein the first blocking body is designed as a pinhole with a passage opening or as a collimator, wherein a diameter of the passage opening of the pinhole or a diameter and a longitudinal extension of the collimator are selected such that the part of the X-ray, close to a central axis of a primary beam of the X-ray, which passes through the passage opening or the collimator, is passed through up to a divergence angle of 10°.

11. The device according to claim 1 , further comprising:
a filter, with which a part of the X-ray, close to a central axis of a primary beam of the X-ray is monochromatized and focused,
wherein the filter, in a case a tungsten anode, has materials ytterbium or hafnium or consists of materials ytterbium or hafnium, and/or in that the filter, in a case of a molybdenum anode, has a material zirconium or consists of a material zirconium, and/or in that the filter, in a case of a silver anode, has a material rhodium or consists of a material rhodium.

12. The device according to claim 1 , wherein the at least one X-ray source comprises an X-ray tube comprising at least one anode consisting of tungsten, molybdenum, and/or silver.

13. The device according to claim 1 , wherein the at least one X-ray source and the at least one X-ray detector are arranged on respective different sides of the polycrystalline product, wherein the X-ray generated by the at least one X-ray source passes through the polycrystalline product.

14. The device according to claim 13 , further comprising:
a second blocking body, which is arranged adjacent the at least one X-ray detector and on a central axis from which the X-ray is emitted by the at least one X-ray source.

15. The device according to claim 1 , wherein the at least one X-ray source and the at least one X-ray detector are arranged on a same side of the polycrystalline product, wherein the X-ray generated by the at least one X-ray source is reflected on a surface of the polycrystalline product.

16. The device according to claim 1 , wherein the mirror surface is rotationally symmetrical with respect to a central axis from which the X-ray is emitted by the at least one X-ray source.

17. A method for determining material properties of a polycrystalline product by means of an X-ray diffraction using at least one X-ray source and at least one X-ray detector, comprising:
generating an X-ray by the at least one X-ray source;
directing the generated X-ray onto a surface of the polycrystalline product and/or the at least one X-ray detector by passing the X-ray though an X-ray mirror, the X-ray mirror being rotationally symmetrical and comprising a mirror surface on an inner circumferential surface so that the X-ray experiences a Bragg's reflection on the mirror surface of the X-ray mirror, and the X-ray is both monochromatized and focused in a direction of the polycrystalline product or in a direction of the polycrystalline product and the at least one X-ray detector; and
recording by the at least one X-ray detector a resulting diffraction image of the X-ray, the at least one X-ray detector being a surface detector,
wherein the polycrystalline product is a metallic product.

18. The method according to claim 17 , wherein the X-ray is passed through the X-ray mirror with the mirror surface that is spherically curved or cylindrical with respect to a central axis from which the X-ray is emitted by the at least one X-ray source.

19. The method according to claim 18 , wherein the at least one X-ray source comprising an X-ray tube that comprises a tungsten anode, a molybdenum anode, and/or a silver anode, and the X-ray is passed through the X-ray mirror having the mirror surface designed with a curvature in such a way that the X-ray generated by the X-ray tube during the Bragg's reflection is selected with an energy range about a predetermined line of an anode material.

20. The method according to claim 19 , wherein the at least one X-ray source comprising the X-ray tube that comprises a tungsten anode, wherein a selection of the energy range of the X-ray about a tungsten Kα line takes place at a value of 60 keV.

21. The method according to claim 19 , wherein the at least one X-ray source comprising the X-ray tube that comprises a molybdenum anode, wherein a selection of the energy range of the X-ray about a molybdenum Kα line takes place at a value of 17.5 keV.

22. The method according to claim 19 , wherein the at least one X-ray source comprising the X-ray tube that comprises a silver anode, wherein a selection of the energy range of the X-ray about a silver Kα line takes place at a value of 25.5 keV.

23. The method

Assignees

• Sms Group Gmbh
• Ims Messsysteme Gmbh

Inventors

• Klinkenberg Christian
• Sommers Ulrich
• Klein Helmut
• Lhoest Alexandre
• Pensis Olivier
• Krauthäuser Horst

Classifications

• G01N23/20008 Primary

  Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor (monochromators for X- rays using crystals G21K1/06) · CPC title

• G01N23/205

  using diffraction cameras · CPC title

• G01N23/207 Primary

  Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions · CPC title

• G01N23/20091

  Measuring the energy-dispersion spectrum [EDS] of diffracted radiation · CPC title

• H01J35/08

  Anodes; Anti cathodes · CPC title