X-ray spectrometer and methods for use

Patent metadata

Field	Value
Publication number	US-11054375-B2
Application number	US-201716333405-A
Country	US
Kind code	B2
Filing date	Sep 15, 2017
Priority date	Sep 15, 2016
Publication date	Jul 6, 2021
Grant date	Jul 6, 2021

Abstract

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

First claim

The invention claimed is:

1. A spectrometer comprising:
a crystal analyzer having a radius of curvature that defines a Rowland circle;
a sample stage configured to support a sample such that the sample is offset from the Rowland circle;
an x-ray source configured to emit unfocused x-rays toward the sample stage; and
a position-sensitive detector that is tangent to the Rowland circle.

2. The spectrometer of claim 1 , wherein the crystal analyzer has a Johann geometry or a Johansson geometry.

3. The spectrometer of claim 1 , wherein the sample stage is configured to support the sample such that the sample is inside of the Rowland circle.

4. The spectrometer of claim 1 , wherein the sample stage is configured to support the sample such that the sample is outside of the Rowland circle.

5. The spectrometer of claim 1 , wherein the x-ray source is configured to emit x-rays having a spot size on a sample, when present, that is at least 0.1 mm in diameter.

6. The spectrometer of claim 1 , wherein the position-sensitive detector comprises a charge-coupled device, a CMOS camera, a stripline detector, a diode array, a phosphorus screen, a spectroscopic camera, or a position-sensitive proportional counter.

7. The spectrometer of claim 1 , wherein the crystal analyzer is configured to redirect, via Bragg reflection, x-rays having a first wavelength coming from different directions to a first position on the position-sensitive detector.

8. The spectrometer of claim 7 , wherein the crystal analyzer is configured to redirect, via Bragg reflection, additional x-rays having a second wavelength coming from different directions to a second position on the position-sensitive detector, wherein the second wavelength is different from the first wavelength and the first position on the position-sensitive detector is different from the second position on the position-sensitive detector.

9. The spectrometer of claim 1 , wherein the spectrometer is integrated into or configured to operate within a glove box or a fume hood.

10. The spectrometer of claim 1 , wherein the spectrometer is operable to distinguish between x-rays having an energy difference as small as 1 electron-volt (eV).

11. The spectrometer of claim 1 , wherein the crystal analyzer and the position-sensitive detector are configured to rotate in unison with respect to the sample stage.

12. The spectrometer of claim 1 , wherein the x-ray source is configured to emit the unfocused x-rays toward the sample stage such that, when the sample is present, the unfocused x-rays are incident upon a surface of the sample that faces the crystal analyzer.

13. The spectrometer of claim 1 , wherein the x-ray source is configured to emit the unfocused x-rays toward the sample stage such that, when the sample is present, the unfocused x-rays are incident upon a surface of the sample that faces away from the crystal analyzer.

14. The spectrometer of claim 1 , wherein the spectrometer is configured such that, for any wavelength of x-ray that originates from the sample stage, there exists an exclusive region of the crystal analyzer that corresponds to that wavelength at which the x-ray could both satisfy a Bragg condition of the crystal analyzer and be redirected by the crystal analyzer to the position-sensitive detector.

15. A method performed via a spectrometer having a crystal analyzer with a radius of curvature that defines a Rowland circle, the method comprising:
emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer;
redirecting, via the crystal analyzer and via Bragg reflection, the x-rays that impinge on the crystal analyzer; and
detecting the redirected x-rays via a position-sensitive detector that is tangent to the Rowland circle.

16. The method of claim 15 , wherein emitting the unfocused x-rays comprises emitting the unfocused x-rays such that the unfocused x-rays are incident upon a surface of the sample that faces the crystal analyzer.

17. A computer-readable medium storing instructions, that when executed by a processor electrically coupled with a spectrometer, cause the spectrometer to perform the method of claim 15 .

18. The method of claim 15 , wherein the method is performed to determine a distribution of nominal oxidation states, identify provenance, and/or examine local chemistries of sulfur in oil shales, crude oil solids, crude oil liquids, refined crude oil products, processed or unprocessed oil shale, coal, coal ash, fly ash, biochars, soil, pigments, gem stones, or sulfur-containing materials that react with air.

19. The method of claim 15 , wherein the method is performed to determine a distribution of nominal oxidation states, identify provenance, and/or examine local chemistries of phosphorus in biochars, lubricants, soil, phosphate-rich ores, or phosphorous-containing materials that react with air.

20. The method of claim 15 , wherein the method is performed to determine a distribution of nominal oxidation states, identify provenance, and/or examine local chemistries of technetium in waste stream products from nuclear fuel processing or recovery, environmental samples showing technetium contamination, or technetium-containing materials that react with air.

Assignees

• Univ Washington

Inventors

• Seidler Gerald Todd
• Hoidn Oliver
• Holden William

Classifications

• G21K2201/064

  having a curved surface · CPC title

• G01N2223/309

  support of sample holder · CPC title

• G01N2223/052

  reflection · CPC title

• G01T7/10

  using turntables · CPC title

• G02B26/0816

  by means of one or more reflecting elements · CPC title