Chemical mechanical polishing pad and preparation thereof

US11679531B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-11679531-B2
Application numberUS-202117500669-A
CountryUS
Kind codeB2
Filing dateOct 13, 2021
Priority dateOct 13, 2021
Publication dateJun 20, 2023
Grant dateJun 20, 2023

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  7. Citations and related patents

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Abstract

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The present invention concerns a chemical mechanical polishing pad having a polishing layer. The polishing layer contains an extruded sheet. The extruded sheet is prepared by extruding a compounded photopolymerizable composition followed by exposure to UV light.

First claim

Opening claim text (preview).

We claim: 1. A process for making an extruded sheet to be used as a polishing layer in a chemical mechanical polishing pad suitable for polishing at least one of a semiconductor substrate, an optical substrate and a magnetic substrate, the process comprising: (a) compounding a photopolymerizable composition comprising a block copolymer, a UV curable acrylate, and a photoinitiator in an extruder, wherein the photopolymerizable composition does not contain any organic solvent; (b) extruding the compounded mixture of step (a) onto a support through a sheet die; (c) passing the product of step (b) through a plurality of calendar rolls; (d) exposing the product of step (c) to a source of UV light; wherein said block copolymer is present at an amount of greater than 50 wt %, based on the total weight of an extruded sheet, and wherein after the UV curing in step (d), the extruded sheet having a Shore D hardness in the range of 40 to 70. 2. The process of claim 1 , further comprising an embossing step between steps (c) and (d) to create a pattern on the product of step (c). 3. The process of claim 1 , wherein said block copolymer is a triblock copolymer. 4. The process of claim 3 , wherein said triblock copolymer is a styrenic block copolymer. 5. The process of claim 4 , wherein said styrenic block copolymer is one or more members selected from the group consisting of a styrene-butadiene-styrene (SBS) block copolymer, a styrene-isoprene-styrene (SIS) block copolymer, a styrene-ethylene-butene-styrene (SEBS) block copolymer, a styrene-ethylene-propylene-styrene (SEPS) block copolymer, and mixtures thereof. 6. The process of claim 1 , wherein said block copolymer is present at an amount of greater than 65%. 7. The process of claim 1 , wherein said acrylate is one or more members selected from the group consisting of 1,3-butylene glycol diacrylate, 1,4-butanediol diacrylate, 1,4-butanediol dimethacrylate, 1,6-hexanediol diacrylate, and mixtures thereof. 8. The process of claim 1 , wherein the extruded sheet has a Shore D hardness in the range of 45 to 55. 9. The process of claim 1 , wherein said photopolymerizable composition further comprises a plasticizer.

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What does patent US11679531B2 cover?
The present invention concerns a chemical mechanical polishing pad having a polishing layer. The polishing layer contains an extruded sheet. The extruded sheet is prepared by extruding a compounded photopolymerizable composition followed by exposure to UV light.
Who is the assignee on this patent?
Rohm & Haas Elect Materials Cmp Holdings Inc, Dupont Electronics Inc
What technology area does this patent fall under?
Primary CPC classification B29C35/0805. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jun 20 2023 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).