Semiconductor packages

US10319702B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10319702-B2
Application numberUS-201815860730-A
CountryUS
Kind codeB2
Filing dateJan 3, 2018
Priority dateAug 9, 2017
Publication dateJun 11, 2019
Grant dateJun 11, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A semiconductor package includes a substrate including a signal pattern on an upper surface thereof, a chip stack on the substrate, and a first semiconductor chip and one or more spacers between the substrate and the chip stack. The chip stack includes one or more second semiconductor chips stacked on the substrate. The one or more spacers and the first semiconductor chip are adjacent to respective corners of a lowermost second semiconductor chip, in plan view. The one or more spacers have the same planar shape as the first semiconductor chip.

First claim

Opening claim text (preview).

What is claimed is: 1. A semiconductor package comprising: a substrate comprising a signal pattern on an upper surface thereof; a chip stack on the upper surface of the substrate; and a first semiconductor chip and one or more spacers that are between the substrate and the chip stack, wherein the first semiconductor chip and the one or more spacers are spaced apart from each other, wherein the chip stack comprises one or more second semiconductor chips stacked on the substrate, and a third semiconductor chip between the substrate and the chip stack, wherein the one or more spacers and the first semiconductor chip are adjacent to respective corners of a lowermost second semiconductor chip, in plan view, and wherein the one or more spacers have a same planar shape as the first semiconductor chip, wherein the third semiconductor chip is laterally spaced apart from the first semiconductor chip and the one or more spacers and is opposite to the first semiconductor chip, wherein the chip stack further comprises one or more fourth semiconductor chips on the one or more second semiconductor chips, wherein the one or more second semiconductor chips have a first offset stack structure of a first stepped shape tilted in a first direction, and wherein the one or more fourth semiconductor chips have a second offset stack structure of a second stepped shape tilted in a second direction that is opposite the first direction, wherein the signal pattern comprises a third signal pad spaced apart from the chip stack in the first direction and electrically connected to the third semiconductor chip, and a fourth signal pad spaced apart from the chip stack in the first direction and electrically connected to at least one of the fourth semiconductor chips, and wherein a third distance between the third signal pad and the fourth signal pad is less than a fourth distance between the fourth signal pad and a second side of the lowermost second semiconductor chip. 2. The semiconductor package according to claim 1 , wherein a gap between the one or more spacers and the first semiconductor chip comprises a first line region extending in a first direction and a second line region extending in a second direction perpendicular to the first direction. 3. The semiconductor package according to claim 2 , further comprising: a molding layer covering the chip stack and filling the gap. 4. The semiconductor package according to claim 1 , wherein the lowermost second semiconductor chip has a first side and a second side that are opposite to each other in a first direction, and wherein a side of the first semiconductor chip is aligned with the first side of the lowermost second semiconductor chip. 5. The semiconductor package according to claim 1 , wherein the first semiconductor chip and the one or more spacers that have the same planar shape as the first semiconductor chip are respectively adjacent to opposite ones of the corners of the lowermost second semiconductor chip, in plan view. 6. The semiconductor package according to claim 1 , wherein the lowermost second semiconductor chip has a first side and a second side that are opposite to each other in a first direction, and wherein the chip stack has an offset stack structure in a stepped shape tilted in a second direction that is opposite to the first direction. 7. The semiconductor package according to claim 6 , wherein the signal pattern comprises: a first signal pad spaced apart from the chip stack in the second direction and electrically connected to the first semiconductor chip, a second signal pad spaced apart from the chip stack in the second direction and electrically connected to the one or more second semiconductor chips; and a conductive line connecting the first signal pad and the second signal pad. 8. The semiconductor package according to claim 7 , wherein a first distance between the first signal pad and the second signal pad is less than a second distance between the second signal pad and the first side of the lowermost second semiconductor chip. 9. The semiconductor package according to claim 1 , wherein the chip stack has a vertical stack structure in which the one or more second semiconductor chips substantially overlap each other entirely, and wherein the one or more second semiconductor chips are electrically connected to the first semiconductor chip through a through-silicon-via passing through the chip stack. 10. The semiconductor package according to claim 1 , wherein a side of the third semiconductor chip is aligned with a side of the lowermost second semiconductor chip. 11. The semiconductor package according to claim 1 , wherein at least one of the one or more second semiconductor chips of the chip stack does not overlap the first semiconductor chip in the plan view.

Assignees

Inventors

Classifications

  • between a chip and a stacked insulating package substrate, interposer or RDL · CPC title

  • between stacked chips · CPC title

  • characterised by the through-semiconductor vias [TSVs] in the stacked chips · CPC title

  • characterised by containers, encapsulations, or other housings for the stacked chips · CPC title

  • at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shape · CPC title

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Frequently asked questions

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What does patent US10319702B2 cover?
A semiconductor package includes a substrate including a signal pattern on an upper surface thereof, a chip stack on the substrate, and a first semiconductor chip and one or more spacers between the substrate and the chip stack. The chip stack includes one or more second semiconductor chips stacked on the substrate. The one or more spacers and the first semiconductor chip are adjacent to respec…
Who is the assignee on this patent?
Park Chul, Lee Seonggwan, Park Minkyeong, and 1 more
What technology area does this patent fall under?
Primary CPC classification H10W90/00. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 11 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).