Metal mask substrate, metal mask substrate control method, metal mask, and metal mask production method

US10273569B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10273569-B2
Application numberUS-201715786463-A
CountryUS
Kind codeB2
Filing dateOct 17, 2017
Priority dateJul 17, 2015
Publication dateApr 30, 2019
Grant dateApr 30, 2019

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A metal mask substrate includes a metal surface to which a resist is to be disposed. A specular reflectance of incident light to the surface is 45.2% or more.

First claim

Opening claim text (preview).

The invention claimed is: 1. A metal mask substrate comprising a metal surface to which a resist is to be disposed, wherein a specular reflectance of incident light to the surface is 45.2% or more, the metal mask substrate has a width direction orthogonal to a rolling direction of the metal mask substrate, a specular reflectance in a first plane orthogonal to the surface and orthogonal to the rolling direction is a first reflectance, a specular reflectance in a second plane orthogonal to the surface and orthogonal to the width direction is a second reflectance, the second reflectance is larger than the first reflectance, and the first reflectance is 45.2% or more. 2. The metal mask substrate according to claim 1 , wherein the surface includes a portion in which a difference obtained by subtracting the first reflectance from the second reflectance is 10.2% or more. 3. The metal mask substrate according to claim 1 , wherein the surface has a three-dimensional surface roughness Sa of 0.11 μm or less and a three-dimensional surface roughness Sz of 3.17 μm or less. 4. The metal mask substrate according to claim 1 , wherein the surface is a first surface, the resist is a first resist, the metal mask substrate further comprising a metal second surface to which a resist is to be disposed, the second surface being a surface opposite to the first surface, and a specular reflectance of incident light to the second surface is 45.2% or more. 5. The metal mask substrate according to claim 1 , wherein the surface is made of invar. 6. The metal mask substrate according to claim 1 , wherein the resist is a dry film resist, and the dry film resist is adhered to the surface.

Assignees

Inventors

Classifications

  • Oblique incidence of vaporised material on substrate · CPC title

  • Compositions for etching metallic material from a metallic material substrate of different composition · CPC title

  • Physical treatment to alter the texture of the substrate surface, e.g. grinding, polishing · CPC title

  • C23C14/042Primary

    using masks · CPC title

  • Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping · CPC title

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Frequently asked questions

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What does patent US10273569B2 cover?
A metal mask substrate includes a metal surface to which a resist is to be disposed. A specular reflectance of incident light to the surface is 45.2% or more.
Who is the assignee on this patent?
Toppan Printing Co Ltd
What technology area does this patent fall under?
Primary CPC classification C23C14/042. Mapped technology areas include Chemistry & Metallurgy.
When was this patent published?
Publication date Tue Apr 30 2019 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 6 related publications on this page (citations in our corpus or others sharing the same primary CPC).