Bridge interconnection with layered interconnect structures

US10103103B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10103103-B2
Application numberUS-201715478858-A
CountryUS
Kind codeB2
Filing dateApr 4, 2017
Priority dateMay 28, 2013
Publication dateOct 16, 2018
Grant dateOct 16, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Embodiments of the present disclosure are directed towards techniques and configurations for layered interconnect structures for bridge interconnection in integrated circuit assemblies. In one embodiment, an apparatus may include a substrate and a bridge embedded in the substrate. The bridge may be configured to route electrical signals between two dies. An interconnect structure, electrically coupled with the bridge, may include a via structure including a first conductive material, a barrier layer including a second conductive material disposed on the via structure, and a solderable material including a third conductive material disposed on the barrier layer. The first conductive material, the second conductive material, and the third conductive material may have different chemical composition. Other embodiments may be described and/or claimed.

First claim

Opening claim text (preview).

What is claimed is: 1. An apparatus comprising: a substrate that includes a patterned metal layer, and a dielectric layer formed over and around the patterned metal layer; a bridge composed of a glass substrate and mounted inside the substrate on the patterned metal layer with an adhesive layer; a first die electrically coupled with the bridge; and a second die electrically coupled with the bridge; wherein the bridge includes one or more electrical routing features disposed therein, to route electrical signals between the first die and the second die, wherein the electrical routing features include one or more pads disposed on and protruding above a surface of the glass substrate of the bridge and disposed inside the dielectric layer of the substrate. 2. The apparatus of claim 1 , wherein the one or more electrical routing features comprise one or more interconnect structures. 3. The apparatus of claim 2 , wherein the first die or the second die are electrically coupled with the bridge by one of the one or more interconnect structures. 4. The apparatus of claim 2 , wherein an interconnect structure of the one or more interconnect structures includes: a via structure that includes a first conductive material, wherein the via structure is to route the electrical signals through at least a portion of the substrate; a barrier layer that includes a second conductive material disposed on the via structure; and a solderable material that includes a third conductive material disposed on the barrier layer; wherein the first conductive material, the second conductive material, and the third conductive material have a different chemical composition from one another. 5. The apparatus of claim 4 , wherein the barrier layer covers a surface of the via structure to inhibit diffusion of the first conductive material. 6. The apparatus of claim 4 , wherein first conductive material comprises copper (Cu), the second conductive material comprises nickel (Ni), and the third conductive material comprises tin (Sn). 7. The apparatus of claim 1 , wherein the first die includes a processor and the second die includes a memory die or another processor. 8. The apparatus of claim 1 , wherein the electrical signals are input/output (I/O) signals. 9. The apparatus of claim 1 , wherein the first die or the second die are further physically coupled with a surface of the substrate. 10. The apparatus of claim 1 , wherein the bridge is an element positioned within a bridge cavity of the substrate. 11. A system comprising: a printed circuit board (PCB); and a package coupled with the PCB, wherein the package includes: a substrate that includes a patterned metal layer, and a dielectric layer formed over and around the patterned metal layer; a bridge composed of a glass substrate and mounted inside the substrate on the patterned metal layer with an adhesive layer; a first die electrically coupled with a bridge; and a second die electrically coupled with the bridge; wherein the bridge includes one or more electrical routing features disposed therein, to route electrical signals between the first die and the second die, wherein the electrical routing features include one or more pads disposed on and protruding above a surface of the substrate of the bridge and disposed inside the dielectric layer of the substrate; and wherein the bridge glass substrate includes a glass material that is different than a material of the substrate. 12. The system of claim 11 , wherein the one or more electrical routing features comprise one or more interconnect structures. 13. The system of claim 12 , wherein the first die or the second die are electrically coupled with the bridge by one of the one or more interconnect structures. 14. The system of claim 12 , wherein an interconnect structure of the one or more interconnect structures includes: a via structure that includes a first conductive material, wherein the via structure is to route the electrical signals through at least a portion of the substrate; a barrier layer that includes a second conductive material disposed on the via structure; and a solderable material that includes a third conductive material disposed on the barrier layer; wherein the first conductive material, the second conductive material, and the third conductive material have a different chemical composition from one another. 15. The system of claim 11 , wherein the first die or the second die are further physically coupled with a surface of the substrate.

Assignees

Inventors

Classifications

  • the bridge chips being embedded in the package substrates, interposers or redistribution layers · CPC title

  • Encapsulations, e.g. protective coatings · CPC title

  • Vias, e.g. via plugs · CPC title

  • on active surfaces of flip-chip devices, e.g. underfills · CPC title

  • Soldering or alloying · CPC title

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Frequently asked questions

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What does patent US10103103B2 cover?
Embodiments of the present disclosure are directed towards techniques and configurations for layered interconnect structures for bridge interconnection in integrated circuit assemblies. In one embodiment, an apparatus may include a substrate and a bridge embedded in the substrate. The bridge may be configured to route electrical signals between two dies. An interconnect structure, electrically …
Who is the assignee on this patent?
Intel Corp
What technology area does this patent fall under?
Primary CPC classification H10W90/00. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Oct 16 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 10 related publications on this page (citations in our corpus or others sharing the same primary CPC).