Defect review sampling and normalization based on defect and design attributes
US-10204290-B2 · Feb 12, 2019 · US
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Yong Poh Boon patents
Yong Poh Boon is listed as an inventor on 6 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Yong Poh Boon |
| Total patents | 6 |
| First publication | Mar 1, 2016 |
| Latest publication | Feb 12, 2019 |
Notable patents
Publications ranked by popularity score, then publication date.
Process condition based dynamic defect inspection
US-10133263-B1 · Nov 20, 2018 · US
Generating a wafer inspection process using bit failures and virtual inspection
US-10014229-B2 · Jul 3, 2018 · US
Defect Review Sampling and Normalization Based on Defect and Design Attributes
US-2018107903-A1 · Apr 19, 2018 · US
Generating a Wafer Inspection Process Using Bit Failures and Virtual Inspection
US-2016163606-A1 · Jun 9, 2016 · US
Generating a wafer inspection process using bit failures and virtual inspection
US-9277186-B2 · Mar 1, 2016 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 8 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 6 |
| G06T7/0004 | 5 |
| G06T2207/30148 | 5 |
| H10P74/23 | 4 |
| H01L22/20 | 4 |