Method for setting up test apparatus and test apparatus
US-12372573-B2 · Jul 29, 2025 · US
Watanabe Shinjiro is listed as an inventor on 16 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Watanabe Shinjiro |
| Total patents | 16 |
| First publication | Mar 5, 2015 |
| Latest publication | Jul 29, 2025 |
Publications ranked by popularity score, then publication date.
US-12372573-B2 · Jul 29, 2025 · US
US-12253559-B2 · Mar 18, 2025 · US
US-2024118338-A1 · Apr 11, 2024 · US
US-2024019483-A1 · Jan 18, 2024 · US
US-2023314362-A1 · Oct 5, 2023 · US
US-11715657-B2 · Aug 1, 2023 · US
US-2022381820-A1 · Dec 1, 2022 · US
US-11499992-B2 · Nov 15, 2022 · US
US-11340259-B2 · May 24, 2022 · US
US-2021210366-A1 · Jul 8, 2021 · US
Latest publications not already listed above.
US-2020242747-A1 · Jul 30, 2020 · US
US-2020191830-A1 · Jun 18, 2020 · US
US-2020166542-A1 · May 28, 2020 · US
US-2019187180-A1 · Jun 20, 2019 · US
US-9296010-B2 · Mar 29, 2016 · US
US-2015059644-A1 · Mar 5, 2015 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Tokyo Electron Ltd | 16 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/2887 | 7 |
| G01R31/2831 | 6 |
| G01R31/2891 | 6 |
| G01R1/07364 | 5 |
| G01R1/07314 | 4 |