Test key design to enable X-ray scatterometry measurement
US-11071513-B2 · Jul 27, 2021 · US
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Wang Chungwei patents
Wang Chungwei is listed as an inventor on 4 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Wang Chungwei |
| Total patents | 4 |
| First publication | Jan 31, 2019 |
| Latest publication | Jul 27, 2021 |
Notable patents
Publications ranked by popularity score, then publication date.
Test Key Design to Enable X-Ray Scatterometry Measurement
US-2020037979-A1 · Feb 6, 2020 · US
Test key design to enable X-ray scatterometry measurement
US-10499876-B2 · Dec 10, 2019 · US
Test Key Design to Enable X-Ray Scatterometry Measurement
US-2019029634-A1 · Jan 31, 2019 · US
Recent patents
Latest publications not already listed above.
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Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Taiwan Semiconductor Mfg Co Ltd | 4 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P95/00 | 4 |
| H10P74/203 | 4 |
| H10P74/27 | 4 |
| H10W46/301 | 4 |
| H10W46/00 | 4 |