Thin layer thickness estimation using electron backscattering
US-2026092774-A1 · Apr 2, 2026 · US
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Vystavel Tomas patents
Vystavel Tomas is listed as an inventor on 20 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Vystavel Tomas |
| Total patents | 20 |
| First publication | Jun 23, 2016 |
| Latest publication | Apr 2, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors
US-12580150-B2 · Mar 17, 2026 · US
Electron count and energy enhanced diffraction analysis
US-2026056147-A1 · Feb 26, 2026 · US
Improved scanning electron microscope and method of using the same
US-2025231130-A1 · Jul 17, 2025 · US
Systems and methods for analyzing a sample using charged particle beams and active pixel control sensors
US-2025201511-A1 · Jun 19, 2025 · US
Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system
US-12106931-B2 · Oct 1, 2024 · US
Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a broad ion beam (bib) system
US-2023377834-A1 · Nov 23, 2023 · US
Offcut angle determination using electron channeling patterns
US-11650171-B2 · May 16, 2023 · US
Offcut angle determination using electron channeling patterns
US-2022412900-A1 · Dec 29, 2022 · US
Method and system for wafer defect inspection
US-11513079-B2 · Nov 29, 2022 · US
Recent patents
Latest publications not already listed above.
Method and system for imaging a multi-pillar sample
US-11476079-B1 · Oct 18, 2022 · US
Method and system for imaging a multi-pillar sample
US-2022319799-A1 · Oct 6, 2022 · US
Method and system for wafer defect inspection
US-2022113262-A1 · Apr 14, 2022 · US
Measurement and endpointing of sample thickness
US-10978272-B2 · Apr 13, 2021 · US
Measurement and endpointing of sample thickness
US-2020135427-A1 · Apr 30, 2020 · US
Method of modifying a sample surface layer from a microscopic sample
US-10105734-B2 · Oct 23, 2018 · US
Reinforced sample for transmission electron microscope
US-9837246-B1 · Dec 5, 2017 · US
Specimen holder for a charged particle microscope
US-9741527-B2 · Aug 22, 2017 · US
Method of modifying a sample surface layer from a microscopic sample
US-2016199878-A1 · Jul 14, 2016 · US
Specimen holder for a charged particle microscope
US-2016181059-A1 · Jun 23, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 20 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/20 | 9 |
| H01J37/28 | 9 |
| H01J2237/31745 | 7 |
| G01N23/203 | 7 |
| G01N23/2251 | 5 |