Reconstruction method for atom probe tomography
US-12500062-B2 · Dec 16, 2025 · US
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Vandervorst Wilfried patents
Vandervorst Wilfried is listed as an inventor on 19 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Vandervorst Wilfried |
| Total patents | 19 |
| First publication | Jul 2, 2015 |
| Latest publication | Dec 16, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
A reconstruction method for atom probe tomography
US-2023307207-A1 · Sep 28, 2023 · US
Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample
US-11549963-B2 · Jan 10, 2023 · US
Method and Apparatus for Aligning a Probe for Scanning Probe Microscopy to the Tip of a Pointed Sample
US-2022065895-A1 · Mar 3, 2022 · US
Device for measuring surface characteristics of a material
US-11125805-B2 · Sep 21, 2021 · US
Method for determining the shape of a sample tip for atom probe tomography
US-10746759-B2 · Aug 18, 2020 · US
Device for measuring surface characteristics of a material
US-2020033395-A1 · Jan 30, 2020 · US
Method and apparatus for transmission electron microscopy
US-10541108-B2 · Jan 21, 2020 · US
Characterization of regions with different crystallinity in materials
US-2020006034-A1 · Jan 2, 2020 · US
Device and method for two dimensional active carrier profiling of semiconductor components
US-10495666-B2 · Dec 3, 2019 · US
Recent patents
Latest publications not already listed above.
Method for determining the shape of a sample tip for atom probe tomography
US-2019277881-A1 · Sep 12, 2019 · US
Device and method for two dimensional active carrier profiling of semiconductor components
US-2019025341-A1 · Jan 24, 2019 · US
Method and apparatus for transmission electron microscopy
US-2018240642-A1 · Aug 23, 2018 · US
Method for differential heating of elongate nano-scaled structures
US-10014178-B2 · Jul 3, 2018 · US
Method for Differential Heating of Elongate Nano-Scaled Structures
US-2017178910-A1 · Jun 22, 2017 · US
Probe configuration and method of fabrication thereof
US-9612258-B2 · Apr 4, 2017 · US
Method for determining local resistivity and carrier concentration using scanning spreading resistance measurement set-up
US-9588137-B2 · Mar 7, 2017 · US
Apparatus and method for atomic force microscopy
US-2015226766-A1 · Aug 13, 2015 · US
Probe configuration and method of fabrication thereof
US-2015185249-A1 · Jul 2, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Imec Vzw | 15 |
| Univ Leuven Kath | 4 |
| Imec | 4 |
| Univ Antwerpen | 2 |
| Bruker Nano Inc | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/285 | 6 |
| H01J37/26 | 5 |
| G01Q60/30 | 5 |
| G01Q10/06 | 4 |
| G01Q30/20 | 4 |