Infrared characterization of a sample using oscillating mode
US-10845382-B2 · Nov 24, 2020 · US
Circuits or algorithms therefor
Circuits or algorithms therefor · Cooperative Patent Classification (CPC)
Computing, optics, measurement, and control technologies.
Related technology areas
Mapped technology topics for this CPC code.
| Metric | Value |
|---|---|
| CPC code | G01Q10/06 |
| Official title | Circuits or algorithms therefor |
| Display label | Circuits or algorithms therefor |
| Total patents | 105 |
Filing trend
Year-over-year patent counts classified under this CPC code.
Filing activity over the last five years is declining.
| Year | Patents |
|---|---|
| 2015 | 10 |
| 2016 | 8 |
| 2017 | 7 |
| 2018 | 14 |
| 2019 | 10 |
| 2020 | 13 |
| 2021 | 9 |
| 2022 | 8 |
| 2023 | 11 |
| 2024 | 9 |
| 2025 | 6 |
Representative patents
Representative publications under this CPC code from precomputed stats, or recent filings when stats are unavailable.
Apparatus for measuring the roughness of a workpiece surface
US-10794678-B2 · Oct 6, 2020 · US
Method for determining the shape of a sample tip for atom probe tomography
US-10746759-B2 · Aug 18, 2020 · US
Scanning probe microscope
US-10697997-B2 · Jun 30, 2020 · US
Imaging a gap between sample and probe of a scanning probe microscope in a substantially horizontal side view
US-10684307-B2 · Jun 16, 2020 · US
Scanning probe microscope
US-10641790-B2 · May 5, 2020 · US
Atomic force microscope, atomic force microscopy, and controlling method of an atomic force microscopy
US-2020081032-A1 · Mar 12, 2020 · US
Scanning probe inspector
US-10585115-B2 · Mar 10, 2020 · US
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
US-2020041541-A1 · Feb 6, 2020 · US
Measuring method of scanning probe microscopy using penetrative pressing force
US-10545170-B2 · Jan 28, 2020 · US
Apparatus and method for a scanning probe microscope
US-2020025796-A1 · Jan 23, 2020 · US
Characterizing a height profile of a sample by side view imaging
US-10488434-B2 · Nov 26, 2019 · US
Scanning probe microscope
US-2019324053-A1 · Oct 24, 2019 · US
Sparse sampling methods and probe systems for analytical instruments
US-10431419-B2 · Oct 1, 2019 · US
Scanning probe microscope
US-2019293680-A1 · Sep 26, 2019 · US
Method for determining the shape of a sample tip for atom probe tomography
US-2019277881-A1 · Sep 12, 2019 · US
Scanning probe microscope and method for increasing a scan speed of a scanning probe microscope in the step-in scan mode
US-2019250185-A1 · Aug 15, 2019 · US
Scanning probe microscopy utilizing separable components
US-10345337-B2 · Jul 9, 2019 · US
Scanning probe inspector
US-2019170788-A1 · Jun 6, 2019 · US
Tuned oscillator atomic force microscopy methods and apparatus
US-2019056428-A1 · Feb 21, 2019 · US
Frequently asked questions
Answers are generated from the same data shown on this page.
- What is CPC G01Q10/06?
- CPC G01Q10/06 is the Cooperative Patent Classification code for “Circuits or algorithms therefor.”
- How many patents are filed under CPC G01Q10/06 (Circuits or algorithms therefor)?
- Our database includes 105 publications tagged with this CPC code.
- Is patent activity under CPC G01Q10/06 growing?
- Publication counts under this code: 9 in 2024 vs 6 in 2025 (latest complete years).