Automated application of drift correction to sample studied under electron microscope
US-2025338020-A1 · Oct 30, 2025 · US
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Uebel Mark patents
Uebel Mark is listed as an inventor on 30 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Uebel Mark |
| Total patents | 30 |
| First publication | Feb 4, 2016 |
| Latest publication | Oct 30, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Automated application of drift correction to sample studied under electron microscope
US-2025260901-A1 · Aug 14, 2025 · US
Automated application of drift correction to sample studied under electron microscope
US-12375815-B2 · Jul 29, 2025 · US
Automated application of drift correction to sample studied under electron microscope
US-12284445-B2 · Apr 22, 2025 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessions
US-2025053594-A1 · Feb 13, 2025 · US
Methods and systems for selectively managing image and metadata from transmission electron microscope (tem) sessions at multiple temporal or spatial resolutions
US-2025029810-A1 · Jan 23, 2025 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
US-12130858-B2 · Oct 29, 2024 · US
Automated application of drift correction to sample studied under electron microscope
US-2024267628-A1 · Aug 8, 2024 · US
Automated application of drift correction to sample studied under electron microscope
US-2024196094-A1 · Jun 13, 2024 · US
Automated application of drift correction to sample studied under electron microscope
US-12010430-B2 · Jun 11, 2024 · US
Recent patents
Latest publications not already listed above.
Automated application of drift correction to sample studied under electron microscope
US-11902665-B2 · Feb 13, 2024 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessions
US-2023418863-A1 · Dec 28, 2023 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
US-11755639-B2 · Sep 12, 2023 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessions
US-2023049691-A1 · Feb 16, 2023 · US
Automated application of drift correction to sample studied under electron microscope
US-2022408024-A1 · Dec 22, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-11514586-B1 · Nov 29, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-2022377244-A1 · Nov 24, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-11477388-B2 · Oct 18, 2022 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessions
US-2022327156-A1 · Oct 13, 2022 · US
Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions
US-11455333-B1 · Sep 27, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-2022247934-A1 · Aug 4, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-11399138-B2 · Jul 26, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-2022103755-A1 · Mar 31, 2022 · US
Automated application of drift correction to sample studied under electron microscope
US-2021235021-A1 · Jul 29, 2021 · US
Automated application of drift correction to sample studied under electron microscope
US-10986279-B1 · Apr 20, 2021 · US
Automated application of drift correction to sample studied under electron microscope
US-2021112203-A1 · Apr 15, 2021 · US
Method for safe control of gas delivery to an electron microscope sample holder
US-10503127-B2 · Dec 10, 2019 · US
Method for safe control of gas delivery to an electron microscope sample holder
US-2018203423-A1 · Jul 19, 2018 · US
Method for safe control of gas delivery to an electron microscope sample holder
US-9915926-B2 · Mar 13, 2018 · US
Method for safe control of gas delivery to an electron microscope sample holder
US-2016033355-A1 · Feb 4, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Protochips Inc | 30 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06T2207/10061 | 25 |
| G06T7/337 | 18 |
| G06T7/215 | 18 |
| H04N23/695 | 18 |
| H01J2237/221 | 12 |