Method for safe control of gas delivery to an electron microscope sample holder

US9915926B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9915926-B2
Application numberUS-201514816332-A
CountryUS
Kind codeB2
Filing dateAug 3, 2015
Priority dateAug 3, 2014
Publication dateMar 13, 2018
Grant dateMar 13, 2018

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

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Abstract

Official abstract text for this publication.

System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.

First claim

Opening claim text (preview).

What is claimed is: 1. A system comprising: an electron microscope sample holder having at least an inlet port, an outlet port, and a cell in fluid communication with the inlet port and outlet port; and a gas delivery system comprising: a gas source device in fluid communication with the inlet port; a gas destination device in fluid communication with the outlet port; a first pressure sensor in fluid communication with at least one of the cell, the inlet port, the outlet port, the gas source device, and the gas destination device; a first valve, wherein the first pressure sensor and first valve are between the gas source device and the inlet port; a second valve between the outlet port and the gas destination device; a second pressure sensor between the outlet port and the gas destination device; a sample holder pressure sensor in fluid communication with the cell; and a controller that monitors the first pressure sensor, the second pressure sensor, and the sample holder pressure sensor, and signals closure of the first valve upon a pressure change as measured by the first pressure sensor. 2. The system of claim 1 , wherein the gas source device comprises a mass flow controller. 3. The system of claim 1 , wherein the gas source device comprises a tank. 4. The system of claim 1 , wherein the gas destination device comprises at least one of a tank and a pump. 5. The system of claim 1 , wherein: the first valve comprises a first normally closed valve that closes when not electrically-activated; and the second valve comprises a second normally closed valve that closes when not electrically-activated. 6. The system of claim 1 , wherein the first pressure sensor is between the gas source device and the first valve. 7. The system of claim 6 , wherein the second pressure sensor is between the gas destination device and the second valve. 8. The system of claim 1 , further comprising: an intermediary valve between the first valve and the inlet port. 9. The system of claim 8 , wherein upon a decrease in pressure of at least one of the first pressure sensor, the second pressure sensor, and the sample holder pressure sensor, the controller signals closure of the first valve, second valve, and intermediary valve to prevent leakage from the system into an electron microscope, wherein a pressure in the electron microscope is less than a pressure of the gas source device, which is less than atmospheric pressure. 10. The system of claim 8 , wherein upon a decrease in pressure of at least one of the first pressure sensor, the second pressure sensor, and the sample holder pressure sensor, the controller signals closure of the first valve, second valve, and intermediary valve to prevent leakage from the system into an atmosphere environment, wherein a pressure in the electron microscope is less than a pressure of the gas source device, which is greater than atmospheric pressure. 11. The system of claim 1 , further comprising a communication and switching bus by which the controller commands the first valve and second valve to be opened or closed. 12. The system of claim 1 , wherein: the first valve closes when not electrically-activated by the controller; and the second valve closes when not electrically-activated by the controller. 13. The system of claim 1 , further comprising an emergency stop device, wherein: the first valve closes when not activated by electrical power; the second valve closes when not activated by electrical power; and electrical power is removed from the first valve and second valve when the emergency stop device is activated. 14. The system of claim 1 , wherein upon an increase in pressure of at least one of the first pressure sensor, the second pressure sensor, and the sample holder pressure sensor, the controller signals closure of the first valve and second valve to prevent leakage from an atmosphere into the system, wherein a pressure in the electron microscope is less than a pressure of the gas source device, which is less than atmospheric pressure. 15. The system of claim 1 , wherein upon a decrease in pressure of at least one of the first pressure sensor, the second pressure sensor, and the sample holder pressure sensor, the controller signals closure of the first valve and second valve to prevent leakage from the system into an electron microscope, wherein a pressure in the electron microscope is less than a pressure of the gas source device, which is greater than atmospheric pressure.

Assignees

Inventors

Classifications

  • Details of gas supplies, e.g. in an ion source, to a beam line, to a specimen or to a workpiece, (H01J37/3244 takes precedence; environmental cells for electron microscopes H01J2237/2003; microscopes with environmental specimen chamber H01J2237/2608) · CPC title

  • Vacuum locks {; Means for obtaining or maintaining the desired pressure within the vessel} · CPC title

  • by action on throttling means (G05D7/0688, G05D7/0694 take precedence) · CPC title

  • for verifying the internal pressure of closed containers · CPC title

  • Holding mechanisms · CPC title

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Frequently asked questions

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What does patent US9915926B2 cover?
System and method for safely controlling the containment of gas within a manifold system and the delivery of gas to a sample holder for an electron microscope for imaging and analysis.
Who is the assignee on this patent?
Protochips Inc
What technology area does this patent fall under?
Primary CPC classification H01J37/20. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Mar 13 2018 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).