Method and apparatus for testing a semiconductor device
US-11150296-B2 · Oct 19, 2021 · US
Tseng Huan Chi is listed as an inventor on 13 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Tseng Huan Chi |
| Total patents | 13 |
| First publication | Mar 10, 2015 |
| Latest publication | Oct 19, 2021 |
Publications ranked by popularity score, then publication date.
US-11150296-B2 · Oct 19, 2021 · US
US-2020132757-A1 · Apr 30, 2020 · US
US-10520545-B2 · Dec 31, 2019 · US
US-9995770-B2 · Jun 12, 2018 · US
US-9639647-B2 · May 2, 2017 · US
US-2017023644-A1 · Jan 26, 2017 · US
US-9459316-B2 · Oct 4, 2016 · US
US-9151798-B2 · Oct 6, 2015 · US
US-2015268271-A1 · Sep 24, 2015 · US
US-9075101-B2 · Jul 7, 2015 · US
Latest publications not already listed above.
US-2015161318-A1 · Jun 11, 2015 · US
US-2015095869-A1 · Apr 2, 2015 · US
US-8978003-B1 · Mar 10, 2015 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Taiwan Semiconductor Mfg Co Ltd | 7 |
| Taiwan Semiconductor Mfg | 6 |
| Shao Jhih Jie | 2 |
| Chung Tang-Hsuan | 2 |
| Huang Szu-Chia | 2 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01R31/3004 | 5 |
| G01R31/30 | 5 |
| G06F30/333 | 4 |
| G06F30/398 | 4 |
| G06F2119/18 | 4 |