Compact shearography system with adjustable shear distance
US-12566058-B2 · Mar 3, 2026 · US
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Smith Daniel Gene patents
Smith Daniel Gene is listed as an inventor on 62 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Smith Daniel Gene |
| Total patents | 62 |
| First publication | Mar 12, 2015 |
| Latest publication | Mar 3, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Optical wedge in fmcw lidar optics system
US-2025334792-A1 · Oct 30, 2025 · US
Curved reticle by mechanical and phase bending along orthogonal axes
US-12346029-B2 · Jul 1, 2025 · US
Metrology for additive manufacturing
US-2025130037-A1 · Apr 24, 2025 · US
Metrology for additive manufacturing
US-12203745-B2 · Jan 21, 2025 · US
Methods for large-scale optical manufacturing
US-2024367257-A1 · Nov 7, 2024 · US
Spatially filtered talbot interferometer for wafer distortion measurement
US-12104891-B1 · Oct 1, 2024 · US
Measurement of a change in a geometrical characteristic and/or position of a workpiece
US-11982521-B2 · May 14, 2024 · US
Optical objective for operation in EUV spectral region
US-11934105-B2 · Mar 19, 2024 · US
Compact shearography system with adjustable shear distance
US-2023296368-A1 · Sep 21, 2023 · US
Recent patents
Latest publications not already listed above.
Optical assembly, method for producing data in the same, and method for manufacturing structure
US-11578969-B2 · Feb 14, 2023 · US
Optical delay system
US-2023015748-A1 · Jan 19, 2023 · US
Curved reticle by mechanical and phase bending along orthogonal axes
US-2022357666-A1 · Nov 10, 2022 · US
Additive manufacturing system with localized controlled environment
US-2022288855-A1 · Sep 15, 2022 · US
E-beam position tracker
US-2022293390-A1 · Sep 15, 2022 · US
Metrology for additive manufacturing
US-2022252392-A1 · Aug 11, 2022 · US
Illumination system with curved 1d-patterned mask for use in EUV-exposure tool
US-11300884-B2 · Apr 12, 2022 · US
Laser radar
US-2022082697-A1 · Mar 17, 2022 · US
Euv lithography system for dense line patterning
US-11099483-B2 · Aug 24, 2021 · US
High-resolution position encoder with image sensor and encoded target pattern
US-11061338-B2 · Jul 13, 2021 · US
Illumination system with flat 1D-patterned mask for use in EUV-exposure tool
US-11054745-B2 · Jul 6, 2021 · US
Compensation for Goos-Hanchen error in autofocus systems
US-10928187-B2 · Feb 23, 2021 · US
Optical assembly, method for producing data in the same, and method for manufacturing structure
US-2021025697-A1 · Jan 28, 2021 · US
EUV lithography system for dense line patterning
US-10890849-B2 · Jan 12, 2021 · US
Optical assembly, method for producing data in the same, and method for manufacturing structure
US-10837763-B2 · Nov 17, 2020 · US
Autofocus system and method
US-10794689-B2 · Oct 6, 2020 · US
Extreme ultraviolet lithography system that utilizes pattern stitching
US-10747117-B2 · Aug 18, 2020 · US
Measurement of a change in a geometrical characteristic and/or position of a workpiece
US-2020232786-A1 · Jul 23, 2020 · US
Correction of errors caused by ambient non-uniformities in a fringe-projection autofocus system in absence of a reference mirror
US-10719017-B2 · Jul 21, 2020 · US
Illumination device for optimizing polarization in an illumination pupil
US-10690317-B2 · Jun 23, 2020 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Nikon Corp | 58 |
| Nippon Kogaku Kk | 4 |
| Goodwin Eric Peter | 3 |
| Smith Daniel Gene | 3 |
| Williamson David Michael | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G03F7/70033 | 12 |
| G03F7/70641 | 9 |
| G03F7/70116 | 9 |
| G01B11/0608 | 8 |
| G02B5/122 | 8 |