Electron source with magnetic suppressor electrode
US-12451319-B2 · Oct 21, 2025 · US
This page is not indexed by search engines while we improve data quality.
Sears Christopher patents
Sears Christopher is listed as an inventor on 61 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Sears Christopher |
| Total patents | 61 |
| First publication | May 7, 2015 |
| Latest publication | Oct 21, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Method and system of image-forming multi-electron beams
US-12165831-B2 · Dec 10, 2024 · US
Joint electron-optical columns for flood-charging and image-forming in voltage contrast wafer inspections
US-12165838-B2 · Dec 10, 2024 · US
Method and system of image-forming multi-electron beams
US-2024096586-A1 · Mar 21, 2024 · US
Detection and correction of system responses in real-time
US-11894214-B2 · Feb 6, 2024 · US
Combining focused ion beam milling and scanning electron microscope imaging
US-2023245933-A1 · Aug 3, 2023 · US
Systems and methods of creating multiple electron beams
US-11651934-B2 · May 16, 2023 · US
Systems and Methods of Creating Multiple Electron Beams
US-2023109032-A1 · Apr 6, 2023 · US
Detection and Correction of System Responses in Real-Time
US-2023045072-A1 · Feb 9, 2023 · US
High resolution electron beam apparatus with dual-aperture schemes
US-11508591-B2 · Nov 22, 2022 · US
Recent patents
Latest publications not already listed above.
Detection and correction of system responses in real-time
US-11508551-B2 · Nov 22, 2022 · US
High resolution electron beam apparatus with dual-aperture schemes
US-2022254667-A1 · Aug 11, 2022 · US
Electron beam system for inspection and review of 3D devices
US-11335608-B2 · May 17, 2022 · US
Field curvature correction for multi-beam inspection systems
US-11302511-B2 · Apr 12, 2022 · US
Space charge insensitive electron gun designs
US-11302510-B2 · Apr 12, 2022 · US
Electron source with magnetic suppressor electrode
US-2022108862-A1 · Apr 7, 2022 · US
Electron beam system for inspection and review of 3d devices
US-2021327770-A1 · Oct 21, 2021 · US
Charge control device for a system with multiple electron beams
US-11087950-B2 · Aug 10, 2021 · US
Micro stigmator array for multi electron beam system
US-11056312-B1 · Jul 6, 2021 · US
Magnetically microfocused electron emission source
US-11037753-B2 · Jun 15, 2021 · US
High resolution electron energy analyzer
US-10964522-B2 · Mar 30, 2021 · US
Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltages
US-10790114-B2 · Sep 29, 2020 · US
Method and system for edge-of-wafer inspection and review
US-10770258-B2 · Sep 8, 2020 · US
Deflection array apparatus for multi-electron beam system
US-10748739-B2 · Aug 18, 2020 · US
Detection and Correction of System Responses in Real-Time
US-2020194224-A1 · Jun 18, 2020 · US
Joint Electron-Optical Columns for Flood-Charging and Image-Forming in Voltage Contrast Wafer Inspections
US-2020194223-A1 · Jun 18, 2020 · US
Deflection Array Apparatus for Multi-Electron Beam System
US-2020118784-A1 · Apr 16, 2020 · US
Magnetically Microfocused Electron Emission Source
US-2020013579-A1 · Jan 9, 2020 · US
High Resolution Electron Energy Analyzer
US-2019378705-A1 · Dec 12, 2019 · US
Charge control device for a system with multiple electron beams
US-2019371566-A1 · Dec 5, 2019 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Kla Tencor Corp | 43 |
| Kla Corp | 21 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 42 |
| H01J37/153 | 27 |
| H01J37/244 | 18 |
| H01J37/1471 | 14 |
| H01J2237/1534 | 13 |