Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications
US-12488957-B2 · Dec 2, 2025 · US
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Rue Chad patents
Rue Chad is listed as an inventor on 39 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Rue Chad |
| Total patents | 39 |
| First publication | Jan 15, 2015 |
| Latest publication | Dec 2, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Carbon containing precursors for beam-induced deposition
US-2025163571-A1 · May 22, 2025 · US
Delayering apparatus and methods
US-2025095959-A1 · Mar 20, 2025 · US
Methods and systems for elemental mapping
US-2024429018-A1 · Dec 26, 2024 · US
Crenellated sample holder and sputter target for sample preparation in cryo electron microscopy applications
US-2024331969-A1 · Oct 3, 2024 · US
Condensate precursors and contaminant purge apparatus and methods
US-2024222068-A1 · Jul 4, 2024 · US
Method of material deposition
US-11798804-B2 · Oct 24, 2023 · US
Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams
US-11735404-B2 · Aug 22, 2023 · US
Method of producing microrods for electron emitters, and associated microrods and electron emitters
US-11651924-B1 · May 16, 2023 · US
Methods and systems for elemental mapping
US-2023095798-A1 · Mar 30, 2023 · US
Recent patents
Latest publications not already listed above.
Method of material deposition
US-11069523-B2 · Jul 20, 2021 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-11062879-B2 · Jul 13, 2021 · US
Method of material deposition
US-2021118678-A1 · Apr 22, 2021 · US
Method for large-area 3d analysis of samples using glancing incidence fib milling
US-2021118646-A1 · Apr 22, 2021 · US
Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams
US-2021066056-A1 · Mar 4, 2021 · US
Method and apparatus for the planarization of surfaces
US-10930514-B2 · Feb 23, 2021 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-2020126756-A1 · Apr 23, 2020 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-10546719-B2 · Jan 28, 2020 · US
Method and Apparatus for the Planarization of Surfaces
US-2019378689-A1 · Dec 12, 2019 · US
Enhanced charged particle beam processes for carbon removal
US-10347463-B2 · Jul 9, 2019 · US
Method, device and system for the treatment of biological cryogenic samples by plasma focused ion beams
US-2019206664-A1 · Jul 4, 2019 · US
Ion implantation to alter etch rate
US-10325754-B2 · Jun 18, 2019 · US
Tomography sample preparation systems and methods with improved speed, automation, and reliability
US-10190953-B2 · Jan 29, 2019 · US
Face-on, gas-assisted etching for plan-view lamellae preparation
US-2018350558-A1 · Dec 6, 2018 · US
Method of material deposition
US-2018277361-A1 · Sep 27, 2018 · US
Enhanced charged particle beam processes for carbon removal
US-2018166272-A1 · Jun 14, 2018 · US
Material characterization using ion channeling imaging
US-9983152-B1 · May 29, 2018 · US
Tomography sample preparation systems and methods with improved speed, automation, and reliability
US-2018143110-A1 · May 24, 2018 · US
Method of material deposition
US-9978586-B2 · May 22, 2018 · US
Material characterization using ion channeling imaging
US-2018136147-A1 · May 17, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Fei Co | 39 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J2237/31749 | 24 |
| H01J2237/31745 | 20 |
| H01J37/3056 | 18 |
| G01N1/32 | 18 |
| H10P50/242 | 11 |