Electron microscope and image capturing method thereof
US-2025349493-A1 · Nov 13, 2025 · US
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Ose Yoichi patents
Ose Yoichi is listed as an inventor on 33 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Ose Yoichi |
| Total patents | 33 |
| First publication | Feb 19, 2015 |
| Latest publication | Nov 13, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Electron beam application device
US-12437958-B2 · Oct 7, 2025 · US
Electron gun and electron beam application device
US-12334297-B2 · Jun 17, 2025 · US
Electron gun and electron microscope
US-12217928-B2 · Feb 4, 2025 · US
Electron gun and electron beam application apparatus
US-12165828-B2 · Dec 10, 2024 · US
Electron beam application device
US-2024161997-A1 · May 16, 2024 · US
Electron microscope
US-2024128049-A1 · Apr 18, 2024 · US
Electron gun and electron beam application apparatus
US-2024120168-A1 · Apr 11, 2024 · US
Electron gun and electron beam application device
US-2023402246-A1 · Dec 14, 2023 · US
Electron beam application device
US-2023335367-A1 · Oct 19, 2023 · US
Recent patents
Latest publications not already listed above.
Electron beam apparatus
US-11784022-B2 · Oct 10, 2023 · US
Electron gun and electron microscope
US-2022406558-A1 · Dec 22, 2022 · US
Electron beam apparatus
US-2022165536-A1 · May 26, 2022 · US
Electron microscope
US-11251011-B2 · Feb 15, 2022 · US
Electron microscope
US-2020303152-A1 · Sep 24, 2020 · US
Electron source and electron beam device using the same
US-10707046-B2 · Jul 7, 2020 · US
Field emission electron source, method for manufacturing same, and electron beam device
US-10586674-B2 · Mar 10, 2020 · US
Electron Source and Electron Beam Device Using the Same
US-2019385809-A1 · Dec 19, 2019 · US
Field Emission Electron Source, Method for Manufacturing Same, and Electron Beam Device
US-2019066966-A1 · Feb 28, 2019 · US
Charged particle-beam device
US-9653256-B2 · May 16, 2017 · US
Ion source and ion beam device using same
US-9640360-B2 · May 2, 2017 · US
Charged particle beam device and arithmetic device
US-9530614-B2 · Dec 27, 2016 · US
Charged-Particle-Beam Device
US-2016300690-A1 · Oct 13, 2016 · US
Electron microscope and electron beam detector
US-9355815-B2 · May 31, 2016 · US
Electron gun and charged particle beam device having an aperture with flare-suppressing coating
US-9293293-B2 · Mar 22, 2016 · US
Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen
US-9202668-B2 · Dec 1, 2015 · US
Device for correcting diffraction aberration of electron beam
US-9123501-B2 · Sep 1, 2015 · US
Charged particle microscope
US-9111716-B2 · Aug 18, 2015 · US
Electron microscope and electron beam detector
US-2015214002-A1 · Jul 30, 2015 · US
Scanning ion microscope and secondary particle control method
US-9058959-B2 · Jun 16, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 33 |
| Ose Yoichi | 2 |
| Fukuda Muneyuki | 1 |
| Sato Mitsugu | 1 |
| Ito Hiroyuki | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 20 |
| H01J37/073 | 18 |
| H01J2237/06333 | 15 |
| H01J37/22 | 9 |
| H01J1/34 | 8 |