Method and apparatus to select a portion of serial test data received from an integrated circuit to capture during test of the integrated circuit
US-2025208195-A1 · Jun 26, 2025 · US
Neeb James is listed as an inventor on 12 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Neeb James |
| Total patents | 12 |
| First publication | Jun 18, 2015 |
| Latest publication | Jun 26, 2025 |
Publications ranked by popularity score, then publication date.
US-2025208195-A1 · Jun 26, 2025 · US
US-2024219452-A1 · Jul 4, 2024 · US
US-11598804-B2 · Mar 7, 2023 · US
US-11193975-B2 · Dec 7, 2021 · US
US-2020300912-A1 · Sep 24, 2020 · US
US-2020003836-A1 · Jan 2, 2020 · US
US-9886401-B2 · Feb 6, 2018 · US
US-2017103028-A1 · Apr 13, 2017 · US
US-9548284-B2 · Jan 17, 2017 · US
US-2016313370-A1 · Oct 27, 2016 · US
Latest publications not already listed above.
US-9454499-B2 · Sep 27, 2016 · US
US-2015171047-A1 · Jun 18, 2015 · US
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Intel Corp | 12 |
| Intel Corportion | 1 |
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G06F11/221 | 3 |
| G06F11/0745 | 3 |
| G06F13/1673 | 3 |
| G06F11/079 | 3 |
| G06F11/0772 | 3 |