Spectroscopic device, spectroscopic method using the same, and method of fabricating semiconductor memory device using the same
US-12593659-B2 · Mar 31, 2026 · US
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Kim Souk patents
Kim Souk is listed as an inventor on 35 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Kim Souk |
| Total patents | 35 |
| First publication | Jan 28, 2016 |
| Latest publication | Mar 31, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Scanning electron microscope with enhanced three-dimensional imaging
US-2026088247-A1 · Mar 26, 2026 · US
Substrate inspection apparatus, substrate processing system including the same, and substrate inspection method using the same
US-2026063571-A1 · Mar 5, 2026 · US
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-2025341540-A1 · Nov 6, 2025 · US
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-12385946-B2 · Aug 12, 2025 · US
Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same
US-12362138-B2 · Jul 15, 2025 · US
Spectroscopic ellipsometer and substrate analysis method using the same
US-2025224326-A1 · Jul 10, 2025 · US
Defect inspection system and defect inspection method
US-2025198941-A1 · Jun 19, 2025 · US
Substrate inspection apparatus and method of inspecting a substrate using the same
US-2025147096-A1 · May 8, 2025 · US
Semiconductor substrate inspection device
US-2025123243-A1 · Apr 17, 2025 · US
Recent patents
Latest publications not already listed above.
Test apparatus and test method thereof
US-2024385220-A1 · Nov 21, 2024 · US
Vibration isolation table for semiconductor equipment and vibration isolation table system including the same
US-12110938-B2 · Oct 8, 2024 · US
Critical dimension prediction system and operation method thereof
US-2024332093-A1 · Oct 3, 2024 · US
Test apparatus and test method thereof
US-12092656-B2 · Sep 17, 2024 · US
Wafer measurement apparatus and operating method thereof
US-2024248051-A1 · Jul 25, 2024 · US
Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device
US-2023194567-A1 · Jun 22, 2023 · US
Spectroscopic device, spectroscopic method using the same, and method of fabricating semiconductor memory device using the same
US-2023154804-A1 · May 18, 2023 · US
Method of operating scanning electron microscope (sem) and method of manufacturing semiconductor device using the same
US-2023140892-A1 · May 11, 2023 · US
Vibration isolation table for semiconductor equipment and vibration isolation table system including the same
US-2023079008-A1 · Mar 16, 2023 · US
Test apparatus and test method thereof
US-2022404395-A1 · Dec 22, 2022 · US
Methods of manufacturing semiconductor device
US-11181831-B2 · Nov 23, 2021 · US
Semiconductor pattern detecting apparatus
US-11017525-B2 · May 25, 2021 · US
Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same
US-11004712-B2 · May 11, 2021 · US
Methods of manufacturing semiconductor device
US-2020194317-A1 · Jun 18, 2020 · US
Measuring apparatus and substrate analysis method using the same
US-2020182783-A1 · Jun 11, 2020 · US
Semiconductor pattern detecting apparatus
US-2020184618-A1 · Jun 11, 2020 · US
Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same
US-2020176292-A1 · Jun 4, 2020 · US
Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement
US-10410937-B2 · Sep 10, 2019 · US
Method of inspecting wafer using electron beam
US-10373796-B2 · Aug 6, 2019 · US
Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement
US-2019181062-A1 · Jun 13, 2019 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 34 |
| Korea Advanced Inst Sci & Tech | 4 |
| Ryu Sungyoon | 1 |
| Hong Seungbum | 1 |
| Kim Kwangeun | 1 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P74/203 | 23 |
| H01L22/12 | 9 |
| G01N21/9501 | 8 |
| G01Q70/10 | 6 |
| G01Q60/24 | 6 |