Electron beam application device
US-12437958-B2 · Oct 7, 2025 · US
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Katane Junichi patents
Katane Junichi is listed as an inventor on 30 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Katane Junichi |
| Total patents | 30 |
| First publication | Nov 10, 2016 |
| Latest publication | Oct 7, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Sample image observation device and method for same
US-12431325-B2 · Sep 30, 2025 · US
Charged particle beam device
US-12400827-B2 · Aug 26, 2025 · US
Electron gun and electron microscope
US-12217928-B2 · Feb 4, 2025 · US
Charged particle beam device
US-2025006454-A1 · Jan 2, 2025 · US
Electron gun and electron beam application apparatus
US-12165828-B2 · Dec 10, 2024 · US
Sample image observation device and method
US-2024222065-A1 · Jul 4, 2024 · US
Electron beam application device
US-2024161997-A1 · May 16, 2024 · US
Electron microscope
US-2024128049-A1 · Apr 18, 2024 · US
Charged particle beam device
US-11961699-B2 · Apr 16, 2024 · US
Recent patents
Latest publications not already listed above.
Electron gun and electron beam application apparatus
US-2024120168-A1 · Apr 11, 2024 · US
Charged particle beam device
US-11823861-B2 · Nov 21, 2023 · US
Electron beam application device
US-2023335367-A1 · Oct 19, 2023 · US
Scanning electron microscope
US-11756763-B2 · Sep 12, 2023 · US
Charged particle beam device
US-2023274907-A1 · Aug 31, 2023 · US
Sample image observation device and method for same
US-2023230799-A1 · Jul 20, 2023 · US
Charged particle beam device
US-11640897-B2 · May 2, 2023 · US
Electron gun and electron microscope
US-2022406558-A1 · Dec 22, 2022 · US
Charged particle beam apparatus
US-11430630-B2 · Aug 30, 2022 · US
Charged particle beam device
US-2022254597-A1 · Aug 11, 2022 · US
Scanning electron microscope
US-2022246393-A1 · Aug 4, 2022 · US
Charged particle beam device
US-2022068593-A1 · Mar 3, 2022 · US
Scanning electron microscope and method for analyzing secondary electron spin polarization
US-11170972-B2 · Nov 9, 2021 · US
Charged particle beam device
US-10886101-B2 · Jan 5, 2021 · US
Scanning electron microscope and method for analyzing secondary electron spin polarization
US-2020402762-A1 · Dec 24, 2020 · US
Charged Particle Beam Device
US-2020251304-A1 · Aug 6, 2020 · US
Charged Particle Beam Apparatus
US-2020219697-A1 · Jul 9, 2020 · US
Charged Particle Beam Device
US-2020090903-A1 · Mar 19, 2020 · US
Charged particle beam device, image generation method, observation system
US-9824854-B2 · Nov 21, 2017 · US
Charged particle beam device, image generation method, observation system
US-2016329188-A1 · Nov 10, 2016 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Hitachi High Tech Corp | 30 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H01J37/28 | 23 |
| H01J37/244 | 16 |
| H01J37/265 | 10 |
| H01J37/141 | 8 |
| H01J2237/2448 | 8 |