Semiconductor device measuring device and method for measuring semiconductor device
US-12540851-B2 · Feb 3, 2026 · US
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Jun Chung Sam patents
Jun Chung Sam is listed as an inventor on 20 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Jun Chung Sam |
| Total patents | 20 |
| First publication | Apr 30, 2015 |
| Latest publication | Feb 3, 2026 |
Notable patents
Publications ranked by popularity score, then publication date.
Semiconductor device measuring device and method for measuring semiconductor device
US-2023101968-A1 · Mar 30, 2023 · US
Scanning probe inspector
US-10585115-B2 · Mar 10, 2020 · US
Scanning probe inspector
US-2019170788-A1 · Jun 6, 2019 · US
Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same
US-10281410-B2 · May 7, 2019 · US
Semiconductor chip inspection device
US-2019114755-A1 · Apr 18, 2019 · US
Apparatus and method for exchanging probe
US-10222414-B2 · Mar 5, 2019 · US
Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same
US-2018356349-A1 · Dec 13, 2018 · US
3D profiling system of semiconductor chip and method for operating the same
US-10068324-B2 · Sep 4, 2018 · US
Semiconductor device inspection apparatus and method of driving the same
US-2018106731-A1 · Apr 19, 2018 · US
Recent patents
Latest publications not already listed above.
Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof
US-9934939-B2 · Apr 3, 2018 · US
Method of inspecting surface and method of manufacturing semiconductor device
US-2018061718-A1 · Mar 1, 2018 · US
Defect inspection method and defect inspection apparatus
US-2018053295-A1 · Feb 22, 2018 · US
Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system
US-9897552-B2 · Feb 20, 2018 · US
Apparatus for forming a thin layer and method of forming a thin layer on a substrate using the same
US-9892983-B2 · Feb 13, 2018 · US
3d profiling system of semiconductor chip and method for operating the same
US-2017169558-A1 · Jun 15, 2017 · US
Structure analysis method using a scanning electron microscope
US-2017162363-A1 · Jun 8, 2017 · US
Apparatus and method for exchanging probe
US-2017160341-A1 · Jun 8, 2017 · US
Process management systems using comparison of statistical data to process parameters and process management devices
US-2015248127-A1 · Sep 3, 2015 · US
Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof
US-2015115154-A1 · Apr 30, 2015 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 20 |
| Nanofocus Inc | 2 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| G01N21/9501 | 8 |
| H10P74/203 | 8 |
| H01J37/28 | 5 |
| G06T2207/30148 | 4 |
| G01Q30/02 | 4 |