System and method for modeling damages caused by incident particles
US-12182486-B2 · Dec 31, 2024 · US
This page is not indexed by search engines while we improve data quality.
Jeon Joohyun patents
Jeon Joohyun is listed as an inventor on 12 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Jeon Joohyun |
| Total patents | 12 |
| First publication | Aug 24, 2017 |
| Latest publication | Dec 31, 2024 |
Notable patents
Publications ranked by popularity score, then publication date.
Image sensor
US-2024405041-A1 · Dec 5, 2024 · US
Plasma process simulation method and semiconductor device manufacturing method including the same
US-2024274416-A1 · Aug 15, 2024 · US
Semiconductor device
US-2023422479-A1 · Dec 28, 2023 · US
System and method for modeling damages caused by incident particles
US-2022309216-A1 · Sep 29, 2022 · US
Method for predicting defect in semiconductor device
US-2022268830-A1 · Aug 25, 2022 · US
Capacitor, semiconductor device and methods of manufacturing the capacitor and the semiconductor device
US-10658454-B2 · May 19, 2020 · US
Capacitor, semiconductor device and methods of manufacturing the capacitor and the semiconductor device
US-2020013853-A1 · Jan 9, 2020 · US
Capacitor, semiconductor device and methods of manufacturing the capacitor and the semiconductor device
US-10453913-B2 · Oct 22, 2019 · US
Semiconductor device and method for manufacturing the same
US-10431680-B2 · Oct 1, 2019 · US
Recent patents
Latest publications not already listed above.
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Samsung Electronics Co Ltd | 12 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10P14/6314 | 4 |
| H10P14/69395 | 4 |
| H10P14/69392 | 4 |
| H10P14/6548 | 4 |
| H10P14/6544 | 4 |