Wafer registration and overlay measurement systems and related methods
US-12230546-B2 · Feb 18, 2025 · US
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Dembi Robert patents
Dembi Robert is listed as an inventor on 13 patents in our database. Major assignees and classification codes are summarized below.
| Metric | Value |
|---|---|
| Inventor | Dembi Robert |
| Total patents | 13 |
| First publication | Dec 4, 2018 |
| Latest publication | Feb 18, 2025 |
Notable patents
Publications ranked by popularity score, then publication date.
Wafer alignment markers, systems, and related methods
US-11520240-B2 · Dec 6, 2022 · US
Wafer registration and overlay measurement systems and related methods
US-2022108927-A1 · Apr 7, 2022 · US
Wafer registration and overlay measurement systems and related methods
US-11251096-B2 · Feb 15, 2022 · US
Apparatus comprising staircase structures
US-11189526-B2 · Nov 30, 2021 · US
Wafer alignment markers, systems, and related methods
US-2021263429-A1 · Aug 26, 2021 · US
Wafer alignment markers, systems, and related methods
US-11009798-B2 · May 18, 2021 · US
Apparatus comprising staircase structures
US-2020194305-A1 · Jun 18, 2020 · US
Methods of forming staircase structures
US-10600681-B2 · Mar 24, 2020 · US
Wafer alignment markers, systems, and related methods
US-2020073257-A1 · Mar 5, 2020 · US
Recent patents
Latest publications not already listed above.
Wafer registration and overlay measurement systems and related methods
US-2020075432-A1 · Mar 5, 2020 · US
Methods of forming staircase structures
US-2019206726-A1 · Jul 4, 2019 · US
Methods of forming staircase structures
US-10147638-B1 · Dec 4, 2018 · US
Major assignees
Companies most often associated with this inventor's publications.
| Assignee | Patents |
|---|---|
| Micron Technology Inc | 13 |
Top CPC classifications
Most common classification codes across this inventor's patents.
| CPC | Patents |
|---|---|
| H10W46/301 | 8 |
| G03F9/7053 | 8 |
| G03F7/70633 | 8 |
| H01L23/544 | 8 |
| H01L2223/54426 | 8 |